System for efficient utilization of multiple test systems

A method for testing an electrical circuit board, comprising:

• providing a first test system;
• providing a second test system;
• connecting said first test system to said second test system so that data can be passed from said first test system to said second test system;
• connecting the electrical circuit board to said first test system;
• said first test system testing the electrical circuit board;
• if the first test system finds no defects on the electrical circuit board, said first test system passing data identifying the electrical circuit board to said second test system to indicate that the electrical circuit board may be tested by said second test system;
• connecting the electrical circuit board to said second test system;
• and
• if said second test system received data identifying the electrical circuit board connected to said second test system indicating that the electrical circuit board may be tested by said second test system, said second test system testing the electrical circuit board.

An apparatus for developing a test for an electronic circuit board, comprising:

• a. a number of computer readable media;
• b. computer readable program code stored on said number of computer readable media, said computer readable program code comprising code for a test analysis system that cooperates with at least two test systems, said test analysis system:
• i. reading a description of said board's board topology;
• ii. analyzing a number of potential defects of the electronic circuit board based on said description;
• iii. creating at least two test procedures for the at least two test systems by:
• (1) creating a first test procedure to test the electronic circuit board on a first test system of the at least two test systems;
• (2) creating at least one other test procedure to test the electronic circuit board on at least one other test system of the at least two test systems;
• and
• (3) optimizing the at least one other test procedure based on at least one other of the at least two test procedures created for the at least two test systems to remove tests for previously tested potential defects and reduce redundancies in the at least two test procedures.