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US 6,310,802 B1Granted
Method and apparatus for reducing bleed currents within a DRAM array having row-to-column shorts
AssigneeMicron Technology, Inc.
InventorsManny Kin F. Ma, Brian Shirley
Life of this patent
Estimating the term…
Abstract
A DRAM memory array is disclosed that uses a current limiting circuit employing current feedback to clamp the current flow to reduced levels than were previously possible. The current limiting circuit comprises a long length, depletion mode transistor that has its gate voltage reduced when row-to-column shorts exist to limit the bleed current. An alternative embodiment uses a P-channel FET in series with the depletion mode transistor and has its gate tied to a negative supply and passes current until both digit lines approach approximately 0.3 Volts.
Claims23
A memory device for an electronic device comprising:
- a complementary pair of digit lines;
- a row line connected to said complementary pair of digit lines;
- a memory cell connected to said complementary pair of digit lines;
- and
- a current limiting circuit connected to said memory cell and said complementary pair of digit lines, said current limiting circuit having a current feed back to limit a current flow through said complementary pair of digit lines when at least one digit line of said complementary pair of digit lines is shorted.
2 more elements
A memory device for an electronic device comprising:
- at least one complementary pair of digit lines;
- a row line connected to said at least one complementary pair of digit lines;
- at least one memory cell connected to said at least one complementary pair of digit lines;
- and
- a current limiting circuit connected to said at least one memory cell and said at least one complementary pair of digit lines, said current limiting circuit having a current feed back limiting a current flow through said at least one complementary pair of digit lines when at least one digit line of said at least one complementary pair of digit lines is shorted to said row line.
2 more elements
A memory array in a memory device comprising:
- a plurality of complementary pairs of digit lines;
- a row line connected to said plurality of complementary pairs of digit lines;
- a plurality of memory cells, at least one memory cell of said plurality of memory cells connected to at least one complementary pair of digit lines of said plurality of complementary pairs of digit lines;
- and
- a plurality of current limiting circuits, at least one current limiting circuit of said plurality of current limiting circuits connected to said at least one memory cell of said plurality of memory cells and said at least one complementary pair of digit lines of said plurality of complementary pairs of digit lines, said at least one current limiting circuit having current feedback for limiting a current flow through said plurality of complementary pairs of digit lines when said at least one complementary pair of digit lines of said complementary pairs of digit lines is shorted, each current limiting circuit of said plurality of current limiting circuits comprising a long length, depletion mode transistor having a gate thereof connected to said plurality of complementary pairs of digit lines.
2 more elements
A memory array of a memory devicefor comprising:
- a plurality of complementary pairs of digit lines;
- a row line connected to said plurality of complementary pairs of digit lines;
- a plurality of memory cells, at least one of said plurality of memory cells being connected to at least one complementary pair of digit lines of said plurality of complementary pairs of digit lines;
- and
- a plurality of current limiting circuits, at least one of said plurality of current limiting circuits being connected to said at least one of said plurality of memory cells and said at least one complementary pair of digit lines of said plurality of complementary pairs of digit lines, said at least one of said plurality of current limiting circuits having current feedback to limit a current flow through said at least one complementary pair of digit lines of said plurality of complementary pairs of digit lines when at least one digit line of said at least one complementary pair of digit lines of said plurality of complementary pairs of digit lines is shorted, each current limiting circuit of said plurality of current limiting circuits comprising:
- a switching transistor connected to said at least one complementary pair of digit lines of said plurality of complementary pairs of digit lines, and having a gate node connected to a negative voltage supply;
- and
- a long length, depletion mode transistor connected to said switching transistor and having a gate node connected to said at least one complementary pair of digit lines of said plurality of complementary pairs of digit lines for providing feedback in controlling and limiting a bleed current when one digit line of said at least one complementary pair of said plurality of complementary pairs of digit lines is shorted.
5 more elements
A memory array of a memory device comprising:
- a pluralitt of complementary pairs of digit lines;
- a row line connected to said plurality of compelementary pairs of digit lines;
- a plurality of memory cells, at least one memory cell of said plurality of memory cells being connected to at least one complementary pair of digit lines of said plurality of complementary pairs of digit lines;
- and
- a plurality of current limiting circuits, at least one of said plurality of current limiting circuits being connected to said at least one memory cell of said plurality of memory cells and said at least one complementary pair of digit lines of said plurality of complementary pairs of digit lines, said at least one of said plurality of current limiting circuits having current feedback, to limit a current flow through said at least one complementary pair of digit lines of said plurality of complementary pairs of digit lines when at least one digit line of said at least one complementary pair of digit lines of said plurality of complementary pairs of digit lines is shorted with another line, each current limiting circuit of said plurality of current limiting circuits comprising a long length, depletion mode transistor having its gate connected to said at least one complementary pair of digit lines of said plurality of complementary pairs of digit lines.
2 more elements
A memory array of a memory device comprising:
- a plurality of complementary pairs of digit lines;
- a row line connected to said plurality of complementary pairs of digit lines;
- a plurality of memory cells, at least one memory cell of said plurality of memory cells connected to at least one of said plurality of complementary pairs of digit lines;
- and
- a plurality of current limiting circuits, at least one current limiting circuit of said plurality of current limiting circuits connected to said at least one of said plurality of memory cells and said at least one of said plurality of complementary pairs of digit lines, said at least one current limiting circuit of said plurality of current limiting circuits having current feedback to limit a current flow through said at least one of said plurality of complementary pairs of digit lines when at least one digit line of said at least one of said plurality of complementary pairs of digit lines is shorted with another line, each current limiting circuit of said plurality of current limiting circuits comprising:
- a switching transistor connected to said at least one of said plurality of complementary pairs of digit lines, said switching transistor having a gate node connected to a negative voltage supply;
- and
- a long length, depletion mode transistor connected to said switching transistor and having a gate node connected to said at least one of said plurality of complementary pairs of digit lines providing feedback controlling a limiting a bleed current when one digit line of said at least one of said plurality of complementary pairs of digit lines is shorted with said row line.
5 more elements
A semiconductor wafer having at least one memory device thereon, said at least one memory deivce comprising:
- a complementary pair of digit lines;
- a row line connected to said complementary pair of digit lines;
- a memory cell connected to said complementary pair of digit lines;
- and
- a current limiting circuit connected to said memory cell and said complementary pair of digit lines, said current limiting circuit having current feedback to limit a current flow through said complementary pair of digit lines when said complementary pair of digit lines is shorted, said current limiting circuit comprising a long length, depletion mode transistor having its gate connected to said complementary pair of digit lines.
2 more elements
A semiconductor wafer having at least one memory device thereon, said at least one memory device comprising:
- a complementary pair of digit lines;
- a row line connected to said complementary pair of digit lines;
- a memory cell connected to said complementary pair of digit lines, and
- a current limiting circuit connected to said memory cell and said complementary pair of digit lines, said current limiting circuit having current feedback to limit a current flow through said complementary pair of digit lines when said complementary pair of digit lines is shorted, said current limiting circuit comprising:
- a switching transistor connected to said complementary pair of digit lines, said switching transistor having a gate node connected to a negative voltage supply;
- and
- a long length, depletion mode transistor connected to said switching transistor, said long length, depletion mode transistor having a gate node connected to said complementary pair of digit lines providing feedback controlling and limiting a bleed current when one digit line of said complementary pair of digit lines is shorted.
4 more elements
A semiconductor wafer having at least one memory device thereon, said at least one memory device comprising:
- a complementary pair of digit lines;
- a row line connected to said complementary pair of digit lines;
- a memory cell connected to said complementary pair of digit lines;
- and
- a current limiting circuit connected to said memory cell and said complementary pair of digit lines, said current limiting circuit having current feedback to limit a current flow through said complementary pair of digit lines when said complementary pair of digit lines is shorted with another line, said current limiting circuit comprising a long length, depletion mode transistor having its gate connected to said complementary pair of digit lines.
2 more elements
A semiconductor wafer having at least one memory device thereon, said at least one memory device comprising:
- a complementary pair of digit lines;
- a row line connected to said complementary pair of digit lines;
- a memory cell connected to said complementary pair of digit lines;
- and
- a current limiting circuit connected to said memory cell and said complementary pair of digit lines, said current limiting circuit having current feedback to limit a current flow through said complementary pair of digit lines when said-complementary pair of digit lines is shorted with another line, said current limiting circuit comprising:
- a switching transistor, connected to said complementary pair of digit lines, and having a gate node connected to a negative voltage supply;
- and
- a long length, depletion mode transistor connected to said switching transistor, said long length, depletion mode transistor having a gate node connected to said complementary pair of digit lines providing feedback controlling and limiting a bleed current when one digit line of said complementary pair of digit lines is shorted with another line.
5 more elements
An isolation method for a complementary pair of data lines having a row to-column short within a memory device, the isolation method comprising:
- determining a voltage feedback of a gate transistor connected to said complementary pair of data lines having a row-to-column short within a memory device;
- and
- reducing a current flow at said row-to-column short when said voltage feedback exceeds a threshold level.
Dependencies are inferred from the claim text.