Integrated test cell
AssigneeTeradyne, Inc.
InventorsDavid Trevisan, Michael A. Caradonna, Paul Trudeau, Isreal Blagdan, A. E. LeColst
Life of this patent
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Abstract
A semiconductor tester is disclosed that is adapted for testing semiconductor devices disposed on a handling apparatus. The semiconductor tester includes a tester housing defining a self-supporting frame and formed with an externally accessible opening adapted for receiving the handling apparatus. A test controller is disposed within the housing and carried by the frame. Pin electronics including tester circuitry are responsive to the test controller and proximately coupled thereto and mounted to the frame. A docking apparatus is disposed above the opening and is adapted to couple the tester circuitry to the handling apparatus.
Claims13
A semiconductor tester adapted for testing semiconductor devices disposed on a handling apparatus, said semiconductor tester including:
- a tester housing adapted for resting on a floor and comprising a manipulator-less self-supporting frame and formed with an externally accessible opening, said opening adapted for receiving said handling apparatus;
- a test controller disposed within said housing and carried by said frame;
- pin electronics including tester circuitry responsive to said test controller and proximately coupled to said test controller and mounted to said manipulator-less self-supporting frame;
- and
- a docking apparatus disposed above said opening and adapted to couple said tester circuitry to said handling apparatus.
Automatic test equipment for testing semiconductor devices, said automatic test equipment including:
- a handling apparatus adapted for securing said semiconductor devices into testable positions;
- a tester housing adapted for resting on a floor and comprising a manipulator-less self-supporting frame and formed with an externally accessible opening, said opening adapted for receiving said handling apparatus;
- a test controller disposed within said housing and carried by said fame;
- pin electronics including tester circuitry responsive to said test controller and proximately coupled to said test controller and mounted to said manipulator-less self-supporting fame;
- and
- a docking apparatus disposed above said opening and adapted to couple said tester circuitry to said handling apparatus.
Dependencies are inferred from the claim text.