Routable high-density interfaces for integrated circuit devices

A terminal pattern for an integrated circuit package having a center and an outer perimeter and comprising a plurality of groups of terminals each of said groups of terminals are substantially organized into a plurality of radial spokes extending from the center to said outer perimeter and forming a routability zone between each of said radial spokes wherein:

• (a) the terminals in each of said groups of terminals are clustered along a reference line segment extending from the pattern center to intersect the device perimeter;
• (b) at least about 90% of the terminals in a given terminal group are each closer to the reference line segment of that terminal group than they are to the reference line segment of another terminal group;
• (c) the position of a terminal in a group is defined by its distance from the pattern center and its offset from the reference line segment;
• (d) at least about 50% of the terminals in a group are not collinear with, but offset from, the reference line segment;
• (e) in at least one of the terminal groups, either the offset of the terminals from the reference line segment is not uniform, or the distance of the terminals from the pattern center does not increase uniformly;
• and
• wherein each terminal in said pattern is sufficiently offset from each other terminal in said pattern consistent with Design Rules.