Beat frequency modulation for plasma generation
AssigneeMicron Technology, Inc.
InventorsKevin G. Donohoe, Marvin F. Hagedorn
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AssigneeMicron Technology, Inc.
InventorsKevin G. Donohoe, Marvin F. Hagedorn
Estimating the term…
An apparatus and method for providing a modulated-bias plasma are described. In particular, a radio frequency (RF) source or collector includes one or more sources to provide differing driving frequencies or bias frequencies, respectively. These frequencies, over time, interfere with one another to produce beating at one or more controllable, infinitely variable beat frequencies. As a beat frequency has significantly fewer cycles per second than a driving or bias frequency, a modulated-bias plasma may be provided without turning power on and off as in conventional “pulsed” plasma systems. Beat frequencies facilitate modulation of the driving or bias frequencies, which may lie within a relatively narrow frequency band. Also, the use of a plurality of driving or bias frequencies facilitates use of more conventional RF sources or collectors owing to lower power requirements at each frequency. In accordance therewith, the apparatus and method described may be employed for plasma etching and/or plasma enhanced vapor deposition.
A method for providing a pulsed plasma, the method comprising:
A method for plasma assisted etching comprising:
A method for plasma etching comprising:
A method for plasma etching of a workpiece, the method comprising:
A method for plasma vapor deposition on a workpiece, the method comprising:
A method for plasma etching a workpiece, the method comprising:
A method for plasma enhanced chemical vapor deposition of at least one layer of material comprising:
A method for plasma vapor deposition of one or more layers comprising:
Dependencies are inferred from the claim text.