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AssigneeTexas Instruments Incorporated
InventorTheodore W. Houston
Estimating the term…
A circuit 10 is provided that comprises a source resistance transistor 12 connected to a common node 14. A word line driver circuit 18 receives current if it is the word line driver selected from the VDD supply voltage through the source resistance transistor 12. The gate of source resistance transistor 12 is connected to a bond pad 22 which can be alternatively connected to the VDD supply voltage through a bond pad 24 or to ground potential through a bond pad 26. The effective threshold voltage of a transistor 18 within driver 16 can be adjusted depending upon how the gate of transistor 12 is connected. In this manner, a circuit can be adjusted to compensate for process variation or to be more optimum for a selected application by adjustment of the effective threshold voltage of selected transistors.
A method of controlling leakage current within an integrated circuit comprising the steps of:
An electronic circuit comprising:
Dependencies are inferred from the claim text.