Position dependent beam quality x-ray filtration
AssigneeGeneral Electric Company
InventorsThomas L. Toth, Carmine F. Vara, Willi W. Hampel
Life of this patent
Estimating the term…
Abstract
The present invention, in one form, is an imaging system which, in one embodiment, utilizes a filter assembly including a plurality of filter portions for altering the intensity and quality of an x-ray beam. Specifically, in one embodiment, by positioning the filter assembly so that the x-ray beam is filtered by the first portion of the filter assembly, the x-ray beam is altered to perform a body portion scan. By positioning the filter assembly to the second portion, the x-ray beam is altered to perform a head portion scan.
Claims35
An x-ray beam filter assembly for an imaging system, the imaging system including a detector array and an x-ray source for radiating an x-ray beam toward the detector array, said filter assembly comprising:
- a fixed filter portion;
- and
- a z-axis movable filter comprising a plurality of portions, wherein each portion configured to alter the x-ray beam intensity and quality.
A method for altering an x-ray beam in an imaging system, the imaging system including a detector array;
- an x-ray source for radiating an x-ray beam toward the detector array;
- and a filter assembly including a movable filter having a plurality of portions each configured to alter the x-ray beam intensity and quality, and a fixed filter portion;
- said method comprising the steps of:
- selecting a scan type;
- positioning the movable filter;
- filtering the x-ray beam through the fixed filter portion and the positioned movable filter;
- and performing an object scan.
A method for altering an x-ray beam in an imaging system, the imaging system including a detector array, an x-ray source for radiating an x-ray beam toward the detector array and a filter assembly including a movable filter having a plurality of portions, wherein the first portion comprises a first filter material, a second filter material and a third filter material positioned between the first filter material and the second filter material, and the movable filter first portion configured to alter the x-ray beam into a first beam and the second portion configured to alter the x-ray beam into a second beam, said method comprising the steps of:
- selecting a scan type;
- positioning the movable filter so the x-ray beam is filtered by the movable filter first portion;
- and
- performing an object scan.
An imaging system including a detector array;
- an x-ray source for radiating an x-ray beam toward the detector array;
- and a filter assembly including a movable filter having a plurality of portions each configured to alter the x-ray beam intensity and quality, and a fixed filter portion;
- said imaging system configured to:
- determine a scan type;
- position the movable filter;
- filter the x-ray beam through the fixed filter portion and the positioned movable filter;
- and
- perform an object scan.
An imaging system including a detector array, an x-ray source for radiating an x-ray beam toward the detector array and a filter assembly including a movable filter having a plurality of portions, wherein said first portion comprises a filter first material, a second filter material and a third filter material positioned between said first filter material and said second filter material, and said movable filter first portion configured to alter the x-ray beam into a first beam and said second portion configured to alter the x-ray beam into a second beam, said imaging system configured to:
- determine a scan type;
- position the movable filter so that the x-ray beam is filtered by said first portion;
- and
- perform an object scan.
Dependencies are inferred from the claim text.