Test carrier with variable force applying mechanism for testing semiconductor components

A test carrier for a semiconductor component comprising:

• a base;
• an interconnect on the base comprising a plurality of first contacts configured to make electrical connections with a plurality of second contacts on the component;
• and
• a force applying mechanism on the base configured to bias the component and the interconnect together, the mechanism comprising an elastomeric biasing member having a tubular, a wave or an accordion shape configured to flatten with a force applied during assembly of the test carrier to exert a first biasing force for making the electrical connections, and to return to the tubular, the wave or the accordion shape following assembly of the test carrier to exert a second biasing force for maintaining the electrical connections.

A test carrier for a semiconductor component comprising:

• a base;
• an interconnect on the base configured to make a plurality of electrical connections with the component;
• a force applying mechanism on the base configured to bias the component and the interconnect together, the mechanism comprising:
• a clamp attachable to the base and movable in a z-direction;
• an elastomeric biasing member proximate to the clamp comprising a tubular element having an opening configured to close as the clamp is moved in the z-direction such that the biasing member exerts a first biasing force during assembly of the test carrier, and to expand following assembly such that the biasing member exerts a second biasing force following assembly of the test carrier.

A test carrier for a semiconductor component comprising:

• a base;
• an interconnect on the base comprising a plurality of first contacts configured to make electrical connections with a plurality of second contacts on the component;
• and
• a force applying mechanism comprising;
• a clamp attachable to the base and movable in a z-direction;
• an elastomeric biasing member in physical contact with the clamp having a tubular, a wave or an accordion shape, the biasing member configured to flatten with a force applied by movement of the clamp in the z-direction to exert a first biasing force for making the electrical connections, and then to return to the tubular, the wave or the accordion shape to exert a second biasing force for maintaining the electrical connections.

A test system for a semiconductor component comprising:

• a test circuitry configured to generate test signals;
• a carrier configured to retain the component in electrical communication with the test circuitry, the carrier comprising:
• a base;
• an interconnect on the base comprising a plurality of first contacts configured to make electrical connections with a plurality of second contacts on the component;
• and
• a force applying mechanism on the base configured to bias the component and the interconnect together, the mechanism comprising an elastomeric biasing member having an opening configured to close with a force exerted during assembly of the test carrier to exert a first biasing force for making the electrical connections, and then to open to exert a second biasing force for maintaining the electrical connections.

A test system for a semiconductor component comprising:

• a test circuitry configured to generate test signals;
• a carrier configured to retain the component in electrical communication with the test circuitry, the carrier comprising:
• a base;
• an interconnect on the base comprising a plurality of first contacts in electrical communication with the test circuitry configured to make electrical connections with a plurality of second contacts on the component;
• a clamp attachable to the base;
• and
• an elastomeric biasing member in physical contact with the clamp having a tubular, a wave or an accordion shape, the biasing member configured to flatten with movement of the clamp to exert a first biasing force for making the electrical connections, and then to return to the tubular, the wave or the accordion shape to exert a second biasing force for maintaining the electrical connections.