Group III-V complex vertical cavity surface emitting laser diode and method for manufacturing the same
AssigneeSamsung Electronics Co., Ltd.
InventorTaek Kim
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Abstract
A Group III-V complex vertical cavity surface emitting laser (VCSEL) diode manufactured using GaN-system III-V nitride, and a method of manufacturing the same, are provided. The Group III-V complex surface emitting laser diode can obtain a sufficient reflectance even with a small number of pairs of a distributed bragg reflector (DBR), by forming DBRs including air layers. Thus, the crystal growth problem is solved. Also, current confinement and waveguiding are realized by AIN lateral oxidation or etching.
Claims25
A method of manufacturing a group III-V complex vertical cavity surface emitting laser diode, comprising the steps of:
- (a) sequentially growing a preliminary lower DBR layer which includes pairs of a lower refractive index material layer and a higher refractive index material layer having a refractive index higher than the lower refractive index material layer, a preliminary cavity layer and a preliminary upper DBR layer which includes pairs of a lower refractive index material layer and a higher refractive index material layer having a refractive index higher than the lower refractive index material layer, on a semiconductor substrate, wherein the preliminary lower and upper DBR layers are each formed of pairs of an AlxGa1−xN layer and an AlyGa1−yN layer when 0≦×<y≦1;
- (b) forming an upper DBR layer by removing the lower refractive index material layers from the preliminary upper DBR layer using a selective etch method and forming air layers having a relatively low refractive index, wherein the lower refractive index material layers are AlyGa1−yN layers;
- (c) forming a cavity by etching the preliminary cavity layer using a second etch method;
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- (d) forming a lower DBR layer by forming low refractive index layers of air by etching the lower refractive index material layers of the preliminary lower DBR layer from the side surface of the preliminary lower DBR layer using the selective etch method, wherein the lower refractive index material layers are AlyGa1−yN layers.
Dependencies are inferred from the claim text.