Complementary semiconductor devices
AssigneeAqere Systems Guardian Corp.
InventorMuhammed A. Shibib
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Abstract
A metal-oxide semiconductor device having an enhanced compatibility for use as a complementary device comprises an additional lateral well region interposed between the source and drain region of the device. In one embodiment, the invention comprises a p-channel DMOS which may be integrated simultaneously on a chip with an n-channel DMOS, the p-channel DMOS having an n-type substrate, an upper self-aligned region disposed in a well region of p-type conductivity, a p-type impurity region disposed in the upper well, the well region of p-type conductivity being interposed between the n-substrate and the n-well region. A double-diffused CMOS structure may be fabricated by adding one implantation step to present technology involving fabrication of n-channel devices.
Claims2
A DMOS or IGBT device having a p-channel the device comprising:
- an n-type substrate having a first doping concentration, the upper boundary of which defines a major surface;
- a lateral lower p-well in the substrate, the lateral lower p-well having a graded doping density profile and having a first depth, the lower and side boundaries of the lower well surrounded by the n-type substrate and the upper boundary of the lower well being contiguous the major surface, wherein an area of the lateral lower p-well adjacent the major surface defines a drain region,
- a gate electrode disposed on a portion of the major surface, the gate electrode having an edge defining an opening to the major surface;
- an upper n-region disposed in the substrate contiguous the lower well, the upper n-region having a second depth less than that of the first depth and an upper surface area contiguous the major surface;
- at least two impurity bodies disposed in the upper n-region, at least one of the impurity bodies being of n-type conductivity and another of the impurity bodies being of p-type conductivity, each of the at least two impurity bodies having a depth less than the second depth, the p-type impurity being in direct contact with the channel for the flow of p-type current in the channel;
- a first conductive region disposed on the major surface in conductive relation with the at least two impurity bodies;
- a second upper well of p-type conductivity disposed in the lower well, the second upper well having a different doping concentration than the lower well, the second upper well further having a third depth less than that of the first depth and an upper surface area contiguous the major surface defining a second upper well boundary,
- a doped body disposed in the second upper well having a concentration of dopants or conductivity type different from that of the second upper well, and
- a second conductive region disposed on the major surface in conductive relation with the doped body;
- wherein the channel extends from the p-type impurity region in conductive relation with the gate electrode along a portion of the upper n-region to the drain region of the lateral lower p-well, the channel forming a passage for the flow of current from the p-type impurity region to the lateral lower p-well to define a p-channel semiconductor device having the n-type substrate so that a CMOS device including an n-channel DMOS or IGBT device and said p-channel DMOS or IGBT device can be formed on the same substrate.
Dependencies are inferred from the claim text.