Loading patent…
AssigneeThe Regents of the University of California
InventorsChenming Hu, Mansun John Chan, Hsing-Jen Wann, Ping Keung Ko
Estimating the term…
An SOI MOSFET having improved electrical characteristics includes a low barrier body contact under the source region, and alternatively under the drain region, to facilitate collection and removal of current carriers generated by impact ionization. Fully-depleted and non-fully-depleted SOI MOSFETs can be integrated on the same chip by providing some transistors with thicker source and drain regions with a recessed channel therebetween and by selective channel dopant implant. Accordingly, digital circuitry and analog circuitry can be combined on one substrate. Improved electrostatic discharge protection is provided by fabricating transistors for the protection circuit directly in the supporting substrate by first removing the silicon thin film and underlying insulation barrier. Alternatively, improved transistors for electrostatic discharge protection can be formed in the silicon film by fabricating the transistor in a plurality of electrically isolated segments, each segment having source and drain regions separated by a channel region with the regions being electrically interconnected with like regions in other segments. Increased ESD current can be realized as compared to the ESD current for a wider unsegmented device.
An integrated circuit comprising
An integrated circuit comprising a first field effect transistor formed in a semiconductor material layer on an insulating layer in a supporting semiconductor substrate, and a second field effect transistor formed in said semiconductor substrate adjacent to said first field effect transistor, said second field effect transistor forming an element in an electrostatic discharge protection circuit, each transistor having a source region, a drain region, and a channel region between said source region and said drain region, said channel region of said first field effect transistor being recessed in height below said source region and said drain region of said first field effect transistor, whereby said first field effect transistor and said second field effect transistor have different threshold voltages.
Dependencies are inferred from the claim text.