Method and system for allowing an integrated circuit to be portably generated from one manufacturing process to another
AssigneeAspec Technology, Inc.
InventorPatrick Yin
Life of this patent
Estimating the term…
Abstract
A system and method is provided which generates integrated circuits for integrated circuits that are portable from process to process. Information generated from an integrated circuit manufactured on a first process is utilized in combination with the parameters of a subsequent manufacturing process to obtain an integrated circuit based upon that second manufacturing process. Through this system and method a particular integrated circuit design is portable from process to process.
Claims11
A method for taking a first integrated circuit from a first manufacturing process and generating a second integrated circuit from a second manufacturing process comprising the steps of:
- (a) providing a first plurality of libraries from the first integrated circuit, the first plurality of libraries including a timing library, a logic cell library, a place and route cell library and a physical cell library;
- the first plurality of libraries defining characteristics of the first integrated circuit including routing grid dimensions of the first integrated circuit, the routing grid dimensions of the first integrated circuit being defined by a grid where signal interconnections and cells are placed;
- and being definable by layout design rules of the first manufacturing process;
- (b) mapping the physical cell library based on layout design rules of the second manufacturing process, the layout design rules of the second manufacturing process defining routing grid dimensions for the second integrated circuit;
- (c) characterizing the physical cell library and producing a timing library based upon a plurality of device models of the second manufacturing process;
- (d) generating a second plurality of libraries including a place and route library;
- the second plurality of libraries defining characteristics of the second integrated circuit;
- and
- (e) utilizing a place and route database of the first manufacturing process and the routing grid dimensions of the first manufacturing process to map into a second place and route data base of the second manufacturing process;
- the place and route database of the second manufacturing process providing routing grid dimensions in such a manner that the position of the cell placements and interconnections are relatively the same as in the first manufacturing process;
- the second place and route database defining the second integrated circuit.
A system for taking a first integrated circuit from a first manufacturing process and generating a second integrated circuit from a second manufacturing process comprising the steps of:
- means for providing a first plurality of libraries from the first integrated circuit, the first plurality of libraries including a timing library, a logic cell library, a place and route cell library and a physical cell library;
- the first plurality of libraries defining characteristics of the first integrated circuit including routing grid dimensions of the first integrated circuit, the routing grid dimensions of the first integrated circuit being defined by a grid where signal interconnections and cells are placed and being definable by layout design rules of the first manufacturing process;
- means for mapping the physical cell library based on layout design rules of the second manufacturing process, the layout design rules of the second manufacturing process defining routing grid dimensions for the second integrated circuit;
- means for characterizing the physical cell library and producing a timing library based upon a plurality of device models of the second manufacturing process;
- means for generating a second plurality of libraries including a place and route library;
- the second plurality of libraries defining characteristics of the second integrated circuit;
- and
- means for utilizing a place and route database of the first manufacturing process and the routing grid dimensions of the first manufacturing process to map into a second place and route data base of the second manufacturing process;
- the place and route database of the second manufacturing process providing routing grid dimensions in such a manner that the position of the cell placements and interconnections are relatively the same as in the first manufacturing process;
- the second place and route database defining the second integrated circuit.
Dependencies are inferred from the claim text.