# US 6,297,995 B1 · Circuit configuration with a temperature-dependent semiconductor component test and repair logic circuit

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- Number: US 6,297,995 B1
- Document ID: US6297995B1
- Status: Granted
- Kind: B1
- Application number: 09/440,721
- Filed: 1999-11-15
- Granted: 2001-10-02
- Earliest claimed: 1998-11-13
- Assignees: Siemens Aktiengesellschaft
- Inventors: Roderick Mc Connell; Detlev Richter
- Web page: https://patentgrep.com/patent/US6297995B1

## CPC

- G01R 31/30: Marginal testing, e.g. by varying supply voltage (testing computers during standby operation or idle time G06F11/22)
- G01R: MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES (indicating correct tuning of resonant circuits H03J3/12)

## Abstract

A circuit configuration with a temperature-dependent semiconductor component self-test and repair logic circuit, in which at least one temperature sensor is provided in a semiconductor chip having a semiconductor component. In addition, the semiconductor component is connected in the semiconductor chip with the self-test and repair logic circuit.

## Claims

### Claim 1

A circuit, comprising:
a semiconductor chip, including:
a semiconductor component;
a self-test and repair logic circuit connected to said semiconductor component; and
at least one temperature sensor connected to said self-test and repair logic circuit, said at least one temperature sensor measuring a temperature of said semiconductor chip.

### Claim 2 (depends on 1)

The circuit according to claim 1, wherein said self-test and repair logic circuit contains a temperature control unit.

### Claim 3 (depends on 1)

The circuit according to claim 1, wherein said temperature control unit switches to a temperature modification mode if a value recorded by said at least one temperature sensor for the temperature of said semiconductor chip lies outside a test temperature range.

### Claim 4 (depends on 1)

The circuit according to claim 1, wherein said self-test and repair logic circuit has a repair logic circuit and a microprocessor functioning as a self-test logic circuit.

### Claim 5 (depends on 4)

The circuit according to claim 4, wherein said self-test logic circuit has a comparator.

### Claim 6 (depends on 1)

The circuit according to claim 1, wherein said semiconductor component is a semiconductor memory having redundant memory cells, said self-test and repair logic circuit sets said redundant memory cells in said semiconductor memory.

### Claim 7 (depends on 6)

The circuit according to claim 6, wherein said semiconductor memory has registers, and said self-test and repair logic circuit connects in said redundant memory cells through setting said registers.

### Claim 8 (depends on 6)

The circuit according to claim 6, wherein said redundant memory cells have non-volatile memory elements, and said self-test and repair logic circuit sets said redundant memory cells through programming of said non-volatile memory elements.