# US 6,295,629 B1 · Focus correcting method and method of manufacturing semiconductor device > Agents: this data is available as JSON from the patentgrep API and MCP server — see https://patentgrep.com/llms.txt - Number: US 6,295,629 B1 - Document ID: US6295629B1 - Status: Granted - Kind: B1 - Application number: 09/266,917 - Filed: 1999-03-12 - Granted: 2001-09-25 - Earliest claimed: 1998-10-26 - Assignees: Mitsubishi Denki Kabushiki Kaisha - Inventors: Toshifumi Suganaga - Web page: https://patentgrep.com/patent/US6295629B1 ## CPC - G03F 7/70641: {Focus} - G03F: PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR; (phototypographic composing devices B41B; photosensitive materials or processes for photographic purposes G03C; electrophotography, sensitive layers or processes therefor G03G) ## Abstract Disclosed herein is how to obtain the magnitude of focus deviation and the direction of the deviation directly from a focus measuring mark. The magnitude of focus deviation is measured from the length of the focus measuring mark (3) in the elongate direction. The length of a tapered part (20) of the focus measuring mark (3) in which the resist gradually becomes thinner is measured from the secondary electron signal waveform of a scanning electron microscope. The direction of the focus deviation is obtained from the measured length of the tapered part (20). ## Claims ### Claim 1 A focus correcting method for use in an aligner capable of adjustment of focus position by setting a focusing value, comprising the steps of: (a) forming a resist pattern with at least one focus measuring mark by exposing a resist by said aligner; (b) measuring length of said at least one focus measuring mark in elongate direction; (c) measuring length of a tapered part of said at least one focus measuring mark in which said resist becomes thinner toward an end of said at least one focus measuring mark; and (d) determining a magnitude of deviation from a best focus on the basis of a measurement in said step (b) and also determining direction of said deviation from said best focus on the basis of a measurement in said step (c) to obtain a deviation amount from said best focus, and then setting said focusing value on the basis of said deviation amount from said best focus. ### Claim 2 (depends on 1) The focus correcting method according to claim 1, further comprising the step of (e) storing data about said deviation amount from said best focus every time said step (d) is repeated for each of a plurality of sets of products of a same type, wherein said step (d) comprises the step of statistically processing said data to calculate a predicted focusing value which enables said best focus in exposure, and setting the focusing value on the basis of said predicted focusing value. ### Claim 3 (depends on 2) The focus correcting method according to claim 2, wherein said step (e) comprises the step of defining a sum of said focusing value and said deviation amount from said best focus as a true deviation, and storing the true deviations about said plurality of sets of products as said data, and in said step (d), the true deviations about a predetermined number of sets of products are extracted from said data stored in said step (e) and an average value of said true deviations about said predetermined number of sets of products is used as said predicted focusing value. ### Claim 4 (depends on 2) The focus correcting method according to claim 2, wherein in said step (d), true deviations about a predetermined number of sets of products are calculated from said data stored, a value proportional to a difference between the true deviations about successively manufactured at least two sets of products in said plurality of sets of products is added to an average value of the true deviations about said predetermined number of sets of products, and a sum of said average value and said difference is used as said predicted focusing value. ### Claim 5 (depends on 1) The focus correcting method according to claim 1, wherein said at least one focus measuring mark is including a plurality of focus measuring marks, and with said plurality of focus measuring marks arranged in one shot, inclination of said shot is calculated on the basis of the true deviations of said resist pattern from said best focus in individual positions of said plurality of focus measuring marks, and said predicted focusing value is obtained by considering the inclination. ### Claim 6 (depends on 1) The focus correcting method according to claim 1, wherein said at least one focus measuring mark is including a plurality of focus measuring marks, and with said plurality of focus measuring marks arranged in peripheral part and center part of one shot, said predicted focusing value is calculated on the basis of a value between the true deviation from said best focus in said peripheral part of said shot and the true deviation from said best focus in said c ent er part of said shot. ### Claim 7 (depends on 1) The focus correcting method according to claim 1, wherein said at least one focus measuring mark is including a plurality of focus measuring marks, and with said plurality of focus measuring marks arranged in a plurality of positions in one shot, the true deviations from said best focus measured at said plurality of positions are weighted in accordance with pattern layout and arrangement in said shot and averaged so as to calculate said predicted focusing value. ### Claim 8 (depends on 1) The focus correcting method according to claim 1, wherein said at least one focus measuring mark is including a plurality of focus measuring marks, and with one of said plurality of focus measuring marks arranged in one position in one shot, an amount of remaining warp of said wafer is calculated on the basis of the deviation amounts of said plurality of focus measuring marks formed in several positions on said wafer in a plurality of exposures, and said predicted focusing value is obtained by considering said amount of remaining warp. ### Claim 9 (depends on 1) The focus correcting method according to claim 1, wherein said at least one focus measuring mark is a polygon having at least one corner having an angle of 90 or smaller. ### Claim 10 A method of manufacturing a semiconductor device using an aligner in which focus is corrected by using a given focus correcting method and focus position can be adjusted by setting a focusing value, comprising the steps of: (a) setting the focusing value; and (b) manufacturing semiconductor devices by using the aligner in which the focus position is adjusted by setting said focusing value; wherein said step (a) comprises the steps of, (c) forming a resist pattern with at least one focus measuring mark by exposing a resist by said aligner; (d) measuring length of said at least one focus measuring mark in elongate direction; (e) measuring length of a tapered part of said at least one focus measuring mark in which said resist becomes thinner toward an end of said at least one focus measuring mark; and (f) determining a magnitude of deviation from a best focus on the basis of a measurement in said step (d) and also determining direction of said deviation from said best focus on the basis of a measurement in said step (e) to obtain a deviation amount from said best focus, and then setting said focusing value on the basis of said deviation amount from said best focus.