Multiple detecting apparatus for physical phenomenon and/or chemical phenomenon
AssigneeHoriba, Ltd.
InventorsKazuaki Sawada, Katsuhiko Tomita, Tsuyoshi Nakanishi, Hiroki Tanabe, Susumu Mimura, Toshihiko Uno
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AssigneeHoriba, Ltd.
InventorsKazuaki Sawada, Katsuhiko Tomita, Tsuyoshi Nakanishi, Hiroki Tanabe, Susumu Mimura, Toshihiko Uno
Estimating the term…
A detector assembly for detecting a plurality of different properties at the same location at the same time is provided by integrating onto a single semiconductor substrate a first detector unit for measuring a first property and a second detector unit for measuring a second property. The first and second detector units can share, for example, a common element, such as a sensor device that can provide electrical output signals representative of, respectively, the first property and the second property. The common element can include a diaphragm with a pyroelectric element to provide a measurement of temperature and pressure.
A detector assembly for detecting a plurality of different properties in a sample, comprising:
A detector assembly for measuring pressure and temperature comprising:
A detector assembly for detecting a plurality of different properties of a specimen, comprising:
A detector assembly for detecting light, pressure and temperature, comprising:
Dependencies are inferred from the claim text.