Method for electrolytically depositing copper on a semiconductor workpiece
AssigneeSemitool, Inc.
InventorLinlin Chen
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AssigneeSemitool, Inc.
InventorLinlin Chen
Estimating the term…
This invention employs a novel approach to the copper metallization of a workpiece, such as a semiconductor workpiece. In accordance with the invention, an alkaline electrolytic copper bath is used to electroplate copper onto a seed layer, electroplate copper directly onto a barrier layer material, or enhance an ultra-thin copper seed layer which has been deposited on the barrier layer using a deposition process such as PVD. The resulting copper layer provides an excellent conformal copper coating that fills trenches, vias, and other microstructures in the workpiece. When used for seed layer enhancement, the resulting copper seed layer provide an excellent conformal copper coating that allows the microstructures to be filled with a copper layer having good uniformity using electrochemical deposition techniques. Further, copper layers that are electroplated in the disclosed manner exhibit low sheet resistance and are readily annealed at low temperatures.
A process for applying a metal structure to a workpiece comprising:
A process for applying a metal structure to a workpiece comprising:
A process for applying a metal structure to a workpiece comprising:
A process for applying a metal structure to a workpiece comprising:
A copper electroplating solution comprising copper sulfate as a source of copper ions at a level so as to be the principal metal species, ammonium sulfate, and ethylene glycol at a levl of greater than 0 to 1.0 Molar, the solution being formulated so as to be suitable for electrodeposition of copper onto a microelectronic workpiece.
Dependencies are inferred from the claim text.