Data processing apparatus for IC tester

A data processing apparatus for an integrated circuit (IC) tester, comprising:

• a first memory;
• a first reconfigurable logic device operative during input and output of data therefrom and thereto, for outputting signals used for generating test vectors for an IC, and for receiving and converting data derived from the IC for internal use in said data processing apparatus, an internal configuration of the first reconfigurable logic device being alterable to accomplish such converting;
• a second reconfigurable logic device for receiving data from, and transmitting data to, the first memory or the first reconfigurable logic device and for processing the data in accordance with an internally configured combination of elements therein, an internal configuration of the second reconfigurable logic device being alterable to accomplish details of said processing of said data;
• a third reconfigurable logic device for establishing a specific interface when data is transmitted and received between the second reconfigurable logic device and the first memory, an internal configuration of the third reconfigurable logic device being alterable in accordance with a selected type of interface with the first memory;
• and
• writing means coupled to each of said first, second and third reconfigurable logic devices for inputting an internal configuration to each thereof.