Method and test system for testing under a plurality of test modes

A testing system for testing functional and/or operational aspects of a device under test (DUT) comprising:

• a testing hardware subsystem comprising
• a first grouping of hardware components associated with a first version of a tester and operable to perform testing under a first testing mode corresponding to operation under the first version of the tester, and
• a second grouping of hardware components associated with a second version of the tester and operable to perform testing under a second testing mode corresponding to operation under the second version of the tester;
• and
• a control subsystem coupled to the testing hardware subsystem, the control subsystem operable to initialize the first and second groupings of hardware components, the control subsystem further operable to direct the testing hardware subsystem to test under one of the first and second testing modes at a given moment.