Device and method for testing input-output ports
AssigneeUnited Microelectronics Corp.
InventorTien-Yow Huang
Life of this patent
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Abstract
A device for testing input-output (I/O) ports is disclosed, which comprises a plurality of switching devices and a decoder employed between the probe card and the device under test (DUT) card. Every switching device possesses an identical number of input ports and output ports to that of the testing I/O ports of the DUT card. The testing I/O ports of the DUT card are connected to the corresponding output ports of every switching device, respectively. The decoder is used to select a switching device, of which the output ports are connected to the DUT card for testing.
Claims15
A device used in a tester for testing I/O ports of an electronic device, comprising:
- a probe card and a device under test (DUT) card, wherein the DUT card comprises a plurality of testing I/O ports and a plurality of addressing ports;
- a plurality of switching devices, wherein the switching device comprises a plurality of input ports, a plurality of output ports, a first control input, and a second control input, wherein the number of input ports and output ports of the switching device is identical to that of the testing I/O ports of the DUT card, wherein the input ports of the switching device are coupled to the probe card, wherein the Ith output ports with the same relative position of all the switching devices are connected together and coupled to the Ith testing I/O port of the DUT card;
- and
- a decoder which comprises a plurality of inputs and outputs, wherein the inputs of the decoder are coupled to the addressing ports of the DUT card, wherein the outputs of the decoder acting as the control signals and complimentary control signals are connected to the first control input and the second control input of the switching devices, respectively, to enable one of the switching devices.
A device used in a tester for testing I/O ports of an electronic device, comprising:
- a device under test (DUT) card, wherein the DUT card comprises a plurality of testing I/O ports and a plurality of addressing ports;
- a plurality of switching devices, wherein the switching device comprises a plurality of input ports, a plurality of output ports, a first control input, and a second control input, wherein the number of input ports and output ports of the switching device is identical to that of the testing I/O ports of the DUT card, wherein the Ith output ports with the same relative position of all the switching devices are connected together and coupled to the Ith testing I/O port of the DUT card;
- and
- a decoder which comprises a plurality of inputs and outputs, wherein the inputs of the decoder are coupled to the addressing ports of the DUT card, wherein the outputs of the decoder acting as the control signals and complimentary control signals are connected to the first control input and the second control input of the switching devices, respectively, to enable one of the switching devices.
A method used in a device under test (DUT) card with a plurality of testing I/O ports and a plurality of switching devices connected to a plurality of addressing ports in a tester for testing I/O ports of an electronic device, comprising the steps of:
- (a) determining the addressing ports physically used;
- (b) performing an addressing operation to select a plurality of I/O ports for testing;
- and
- (c) performing a testing operation.
Dependencies are inferred from the claim text.