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US 6,288,958 B1Granted
Semiconductor storage device and burn-in test method
AssigneeNEC Corporation
InventorJunnichi Suzuki
Life of this patent
Estimating the term…
Abstract
A semiconductor storage device may shorten burn-in test times without adversely affecting a normal mode of operation. According to one embodiment, a determination circuit 60 can select multiple memory section (10 and 20) simultaneously in a burn-in test, and prevent such a simultaneous selection of multiple memory sections (10 and 20) in a normal mode of operation.
Claims20
A semiconductor storage device, comprising:
- a plurality of memory sections, each memory section including memory cells of a different type;
- and
- controlling means for simultaneously operating the memory sections in a burn-in mode and preventing the simultaneous operation of the memory sections in a normal mode.
A semiconductor storage device, comprising:
- a determination circuit that receives at least one control signal and a plurality of section select signals, the determination circuit activating no more than one memory section according to particular section select signal combinations when the at least one control signal has a first value, the determination circuit activating at least two memory sections when the at least one control signal has a second value.
A method of operating a semiconductor storage device having a plurality of memory sections of different types, comprising:
- operating a plurality of memory sections in a burn-in test mode;
- and
- preventing the operation of more than one memory section in a normal mode.
Dependencies are inferred from the claim text.