Semiconductor memory device having test mode and method for testing semiconductor therewith
AssigneeMitsubishi Denki Kabushiki Kaisha
InventorsTetsuo Katoh, Kiyohiro Furutani, Mitsutomi Yamashita
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Abstract
In an SDRAM chip, two signal generation circuits are provided corresponding to two test circuits arranged at either ends of a rectangular semiconductor substrate. Each signal generation circuit is provided in the proximity of corresponding test circuit. Hence, a signal line for test signal can be reduced and smaller chip area can be achieved compared with the conventional case where one signal generation circuit is provided at a center of the semiconductor substrate and a test signal is supplied to two test circuits from the signal generation circuit.
Claims3
A semiconductor memory device formed on a semiconductor substrate having a plurality of test modes, comprising:
- a plurality of memory cells arranged like a matrix;
- a plurality of signal transmission lines for transmitting first to Mth (where M is an integer at least 2) address signals and a test mode entry signal;
- a select circuit selecting a memory cell among said plurality of memory cells according to first to Mth address signals supplied via said plurality of signal transmission lines;
- a read/write circuit reading/writing data from/to the memory cell selected by said select circuit;
- a plurality of test circuits dispersedly provided on said semiconductor substrate for performing said plurality of test modes;
- and
- a signal generation circuit provided in a proximity of each corresponding test circuit for supplying a test signal to the corresponding test circuit to perform a corresponding test mode in response to the supply of N (where N is an integer at least 1 and at most M) address signals corresponding to the corresponding test mode among said first to Mth address signals and said test mode entry signal through said plurality of signal transmission lines.
Dependencies are inferred from the claim text.