Circuits and methods for testing logic devices by modulating a test voltage with a noise signal
AssigneeSamsung Electronics Co., Ltd.
InventorsSung-jun Yun, Ki-hun Jung, Yun-ki Kim, Hyun-deok Park
Life of this patent
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Abstract
Noise is introduced into test inputs and voltage supplies provided to logic devices while under going testing by modulating a test voltage output with a noise signal to produce the test input. In particular, a noise signal and a test voltage output are generated. The test voltage output is modulated with the noise signal to provide a test input to the logic device. A more accurate approximation of an actual operating environment is thereby provided.
Claims27
A circuit that provides a test input to a logic device, wherein the logic device functions in response to the test input provided to the logic device while under testing, the circuit comprising:
- a test voltage generator that produces a test voltage output;
- a noise generator that produces a noise signal;
- and
- an analog modulator, responsive to the test voltage generator and the noise generator, that modulates the test voltage output with the noise signal to produce the test input.
A circuit that provides a test input to a logic device, wherein the logic device functions in response to the test input provided to the logic device while under testing, the circuit comprising:
- a test voltage generator that produces a test voltage output;
- a noise generator that produces a noise signal;
- an analog modulator, responsive to the test voltage generator and the noise generator, that modulates the test voltage output with the noise signal to produce the test input;
- and
- wherein said analog modulator comprises:
- an inductor, responsive to said test voltage generator;
- a capacitor, responsive to said noise generator;
- and a resistor that provides impedance matching between the logic device and said analog modulator, wherein the inductor, the capacitor, and the resistor are connected to a common node at an output of the analog modulator to provide the test input signal.
A method of generating a test input, wherein the test input is provided to a logic device that functions in response to the test input provided to the logic device while under testing, the method comprising the steps of:
- generating a test voltage output;
- generating a noise signal;
- and
- combining the test voltage output with the noise signal to produce the test input, using an analog modulator.
A system that provides a test input to a logic device, wherein the logic device functions in response to the test input provided to the logic device while under testing, the system comprising:
- means for generating a test voltage output;
- means for generating a noise signal;
- and
- means, responsive to said means for generating a test voltage output and said means for generating a noise signal, for combining the test voltage output with the noise signal to produce the test input using an analog modulator.
A circuit that provides a power supply test input to a logic device, wherein the logic device functions in response to the power supply test input provided to the logic device while under testing, the circuit comprising:
- a power supply test voltage generator that produces a power supply test voltage output;
- a power supply noise generator that produces a power supply noise signal;
- and
- an analog modulator, responsive to the power supply test voltage generator and the power supply noise generator, that modulates the power supply test voltage output with the power supply noise signal to produce the power supply test input.
A system that provides a test input to a logic device, wherein the logic device functions in response to the test input provided to the logic device while under testing, the system comprising:
- means for generating a test voltage output;
- means for generating a noise signal;
- and
- means for analog combining the test voltage output with the noise signal to produce the test input, responsive to said means for generating a test voltage output and said means for generating a noise signal, wherein the means for analog combining comprises:
- inductive means, responsive to said means for generating a test voltage output;
- capacitive means, responsive to said means for generating a noise signal;
- and
- resistive means for providing impedance matching between the logic device and said means for analog combining, wherein the inductive means, the capacitive means, and the resistive means are connected to a common node at an output of the means for analog combining to provide the test input.
A circuit that provides a power supply test input to a logic device, wherein the logic device functions in response to the power supply test input provided to the logic device while under testing, the circuit comprising:
- a power supply test voltage generator that produces a power supply test voltage output;
- a power supply noise generator that produces a power supply noise signal;
- an analog modulator, responsive to the power supply test voltage generator and the power supply noise generator, that modulates the power supply test voltage output with the power supply noise signal to produce the power supply test input;
- and
- wherein the analog modulator comprises:
- an inductor, responsive to said power supply test voltage generator generator;
- a capacitor, responsive to said power supply noise generator, and a resistor that provides impedance matching between the logic device and said modulator, wherein the inductor, the capacitor, and the resistor are connected to a common node at an output of the analog modulator to provide the power supply test input.
A circuit external to an integrated circuit logic device that provides a test input to the integrated circuit logic device, wherein the integrated circuit logic device functions in response to the test input provided to the logic device while under testing, the circuit comprising:
- a test voltage generator, external to the integrated circuit logic device, that produces a test voltage output;
- a noise generator, external to the integrated circuit logic device, that produces a noise signal;
- and
- an analog modulator, external to the integrated circuit logic device, responsive to the test voltage generator and the noise generator, that modulates the test voltage output with the noise signal to produce the test input.
A method of generating a test input that is provided to an integrated circuit logic device that functions in response to the test input provided to the integrated circuit logic device while under testing, the method comprising the steps of:
- generating a test voltage output external to the integrated circuit logic device;
- generating a noise signal external to the integrated circuit logic device;
- and
- combining the test voltage output with the noise signal to produce the test input, using an analog modulator that is external to the integrated circuit logic device.
Dependencies are inferred from the claim text.