Measuring signals in a tester system
AssigneeSchlumberger Technologies, Inc.
InventorBurnell G. West
Life of this patent
Estimating the term…
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AssigneeSchlumberger Technologies, Inc.
InventorBurnell G. West
Estimating the term…
Apparatus and method for measuring the time interval between a first event and a second event in a tester system. First and second time measurement circuits independently receive respective first and second events. The time measurement circuits each includes a coarse counter clocked by the master clock. The first coarse counter is activated by an initial event, and the first coarse counter stops counting upon activation of the first event. The second coarse counter is also activated by the initial event, and the second coarse counter stops counting upon activation of the second event. A first fine counter clocked by the master clock produces a count value representing the time interval between the first event and a first leading edge of the master clock. A second fine counter clocked by the master clock produces a count value representing the time interval between the second event and a second leading edge of the master clock.
An interpolating circuit for use with a counter clocked by a master clock in a tester system, the interpolating circuit comprising:
Dependencies are inferred from the claim text.