Device and method for repairing a memory array by storing each bit in multiple memory cells in the array
AssigneeMicron Technology, Inc.
InventorMichael A. Shore
Life of this patent
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AssigneeMicron Technology, Inc.
InventorMichael A. Shore
Estimating the term…
A DRAM array is repairable when the array includes memory cells that are defective because their storage capacitors are unable to retain a sufficient electric charge to properly store “1” and “0” bits. To repair the array, both even and odd row decoders in the array are permanently enabled so that each row address the array receives causes the even row decoder to energize at least one even word line and the odd row decoder to energize at least one odd word line. As a result, at least two memory cells are accessed for each row address so that each “1” or “0” bit is stored as an electric charge in at least two memory cells. By grouping enough memory cells together in this manner to store each “1” and “0” bit, the grouped memory cells are able to retain a sufficient total electric charge as a group to properly store each bit even when individual memory cells in the group are unable to do so.
A refreshable dynamic memory system having a memory array, comprising:
A memory system comprising:
A memory system comprising:
Apparatus used with a memory array including a pair of complementary digit lines through which a plurality of memory cells activated by a plurality of word lines selected in accordance with row addresses for said plurality of memory cells may be accessed, the apparatus comprising:
A memory array where stored bits are accessed by detecting a change in voltage between two digit line conductors caused by sharing a charge stored in one memory cell of a plurality of memory cells in the memory array with one of the two digit line conductors, an apparatus for charging the memory array when at least one memory cell of said plurality of memory cells in the memory array cannot retain a sufficient charge to cause a detectable change in the voltage on said one of said two digit line conductors, the apparatus comprising:
An apparatus for use with a memory array including a pair of complementary digit lines through which a plurality of memory cells activated by a plurality of word lines selected in accordance with row addresses for said plurality of memory cells may be accessed, the apparatus comprising:
An apparatus used with a memory array including a plurality of pairs of complementary digit lines through which a plurality of memory cells activated by a plurality of word lines selected in accordance with addresses may be accessed, the apparatus comprising:
An apparatus for repairing a memory array including a pair of complementary digit lines through which a plurality of memory cells activated by a plurality of word lines selected in accordance with row addresses may be accessed, the apparatus comprising:
A memory apparatus comporising:
An integrated circuit memory device comprising:
A semiconductor wafer including at least one integrated circuit memory device comprising:
An electronic apparatus including an input device, an output device, at least one memory device, and a processor device coupled to the input, output, and the at least one memory device, the at least one memory device comprising:
In a memory device having a memory array in which stored bits are accessed by detecting a change in voltage between two conductors caused by sharing a charge stored in one of the plurality of memory cells in the array with one of the two conductors, an apparatus for effecting the memory array when at least one memory cell of the plurality of memory cells in the memory array cannot retian a sufficient charge to cause a detectable change in voltage on one of the two conductors, the apparatus comprising circuitry for directing each memory cell in a group of the plurality of memory cells to store a charge representing a single stored bit and for directing said each memory cell in the group of the memory cells to share its stored charge with one of the two conductors when the single stored bit is to be accessed.
An apparatus for effecting refreshing a memory array including a pair of complementary digit lines through which a plurality of memory cells activated by a plurality of word lines selected in accordance with row addresses may be accessed, the apparatus comprising:
An apparatus for improving the refreshing of a memory array including a plurality of pairs of complementary digit lines through which a plurality of memory cells activated by a plurality of word lines selected in accordance with row addresses may be accessed, the apparatus comprising:
A method of testing the charging of a memory array of a type to store a bit by storing a charge in a memory cell, the memory array also being a type to access the bit by sharing the stored charge with one of two conductors and then detecting a resulting change in voltage between the one of two conductors, the method comprisin:
Dependencies are inferred from the claim text.