Integrated memory having redundant units of memory cells, and test method for the redundant units
AssigneeInfineon Technologies AG
InventorsPeter Schrögmeier, Stefan Dietrich, Sabine Schöniger, Christian Weis
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AssigneeInfineon Technologies AG
InventorsPeter Schrögmeier, Stefan Dietrich, Sabine Schöniger, Christian Weis
Estimating the term…
Each redundant unit of an integrated memory device is assigned respective programmable elements, comparison units, a code converting unit, a logic unit and a multiplexer. Each multiplexer has a first switching state, in which it connects outputs of the first comparison units to first inputs of the logic unit, and a second switching state, in which it connects outputs of the code converting unit to the first inputs of the logic unit. In the second switching state of the multiplexers, each redundant unit is assigned a different address in the unprogrammed state of the programmable elements. Therefore, redundant units can be selected individually for test purposes.
An memory configuration, comprising:
A method for testing redundant units of an integrated memory, the method which comprises:
Dependencies are inferred from the claim text.