Dimension measurement using both coherent and white light interferometers
AssigneeMitutoyo Corporation
InventorTatsuya Narumi
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AssigneeMitutoyo Corporation
InventorTatsuya Narumi
Estimating the term…
An interferometer and method for performing preliminary and main measurements quickly and with high precision are provided. Laser light and white light are successively introduced to the same interferometer booth. Laser light is introduced from a laser light source, and the interference fringe with a reference mirror as a reference is detected using a CCD and a personal computer. By setting the interference fringe to a preset value, the position of a work is adjusted. White light from a halogen lamp is then introduced, a corner cube moving mount is moved, interference fringe with a reference mirror as a reference is detected, and preliminary measurement of the work is performed. Next, laser light is introduced, interference fringe with a reference mirror as a reference is detected, and the main measurement of the work is performed. Because the preliminary and main measurements are performed within the same interferometer booth, the number of steps is reduced and high precision preliminary measurement can be performed.
An interferometer for measuring dimension of a work using laser light interference comprising;
A method of measuring a work using an interferometer comprising:
Dependencies are inferred from the claim text.