Method for controlling stages, apparatus therefor, and scanning type exposure apparatus
AssigneeNikon Corporation
InventorMasateru Tokunaga
Life of this patent
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AssigneeNikon Corporation
InventorMasateru Tokunaga
Estimating the term…
In a scanning type exposure apparatus, a reticle coarse movement stage 22 and a wafer stage 20 are simultaneously scanned in a predetermined scanning direction or directions, in which a position control system 44 for a reticle fine movement stage detects a positional discrepancy amount between the wafer stage 20 and the reticle fine movement stage 24, and calculates a vibration amount of a vibration-preventive pedestal 12. The both stages 20, 22 are driven and controlled so that positional discrepancy is corrected on the basis of the detected positional discrepancy amount and the calculated vibration amount. Accordingly, even if a vibration occurs on the vibration-preventive pedestal 12 during acceleration for scanning for the stages 20, 22, an error affected by the vibration is taken into consideration, and correction is made at a predetermined time interval so that the positional relationship between the stages 20, 24 becomes a predetermined synchronized relationship.
A method for controlling stages for an exposure apparatus comprising a mask stage for holding a mask, which is movable in at least one predetermined scanning direction, a substrate stage for holding a substrate, which is movable in the at least one scanning direction in synchronization with the mask stage, and a vibration-preventive pedestal for supporting the substrate stage, said method comprising:
A scanning type exposure method for an exposure apparatus comprising a mask stage for holding a mask, which is movable in a predetermined scanning direction, a substrate stage for holding a substrate, which is movable in the scanning direction in synchronization with the mask stage, and a vibration-preventive pedestal for supporting the substrate stage, said method comprising:
An apparatus for controlling stages to be used for an exposure apparatus comprising a mask stage for holding a mask, which is movable in a predetermined scanning direction, a substrate stage for holding a substrate, which is movable in the scanning direction, and a vibration-prevention pedestal for supporting the substrate stage, said apparatus comprising:
An apparatus for controlling stages to be used for an exposure apparatus comprising a mask stage for holding mask, which is movable in a predetermined scanning direction, a substrate stage for holding a substrate, which is movable in the scanning direction, and a vibration-preventive pedestal for supporting the substrate stage, said apparatus comprising:
A scanning type exposure apparatus comprising:
An exposure apparatus for exposing a substrate with a pattern formed on a mask while moving the mask and substrate synchronously, comprising:
An exposure method for exposing a substrate with a pattern formed on a mask while moving a mask stage for holding the mask and a substrate stage for holding the substrate synchronously, comprising:
The exposure method according to claim 20, wherein the mask stage comprises a coarse movement stage and a fine movement stage, and a positional discrepancy of the fine movement stage relative to the substrate stage is corrected by controlling the fine movement stage.
A method for controlling a first stage for holding a first object and a second stage for holding a second object to move the first and second stages synchronously, comprising:
An exposure apparatus, comprising:
A method for maing an exposure apparatus, comprising:
A method for controlling a first stage and a second stage comprising:
Dependencies are inferred from the claim text.