Apparatus for electronically testing printed circuit boards or the like

In a testing apparatus for electronically testing printed circuit boards or other products, the improvement comprising, in combination, a plurality of integrally formed, generally parallel test pins for making electrical contact between areas on a product to be tested and corresponding contact elements of an electrical test system, each of said test pins having a first tapered end and a second tapered end defining a length of each of the test pins and further having a continuously uniform diameter along an entire length defined between the first tapered end and the second tapered end except for a section of reduced cross-section along a portion of the entire length of each of the test pins intermediate the first tapered end and the second tapered end thereof to define shoulder means at an end of said section of reduced cross-section wherein the uniform diameter is the maximum diameter of the pin along the length and further wherein the first tapered end of the test pin contacts the product to be tested and the second tapered end of the test pin contacts a contact element of the electrical test system, and compliant plate means having holes formed therein in which said plurality of test pins are mounted, said holes in said compliant plate means having a diameter less than the diameter of said test pins but larger than the diameter of said section of reduced cross-section, said test pins mounted with said section of reduced cross-section located in said holes, whereby said test pins must be forced through said holes, temporarily enlarging the same until said section of reduced cross-section of said test pins is positioned in said holes, said length of said sections of reduced cross-section being greater than the thickness of said plate means whereby free longitudinal movement of said test pins is permitted an amount limited by the length of said section of reduced cross-section.

In a testing apparatus for electronically testing printed circuit boards or other products, the improvement comprising, in combination, a plurality of integrally formed, generally parallel test pins for making electrical contact between areas on a product to be tested and corresponding contact elements of an electrical test system, said test pins made of round wire and having a first tapered end and a second tapered end defining a length of each of the test pins and further having a continuously uniform diameter along an entire length defined between the first tapered end and the second tapered end except for a section of reduced diameter formed along a portion of the entire length of each of the test pins intermediate the first tapered end and the second tapered end thereof by machining a groove therein to thereby define shoulder means at the opposite ends of said groove wherein the uniform diameter is the maximum diameter of the pin along the length and further wherein the first tapered end of the test pin contacts the product to be tested and the second tapered end of the test pin contacts a contact element of the electrical test system, and compliant plate means having holes formed therein through which said plurality of test pins pass, said holes in said compliant plate means having a diameter less than the diameter of said test pins but larger that the diameter of said groove portion of said test pins, whereby said test pins must be forced through said holes temporarily enlarging the same until said grooved portion of reduced diameter of said test pins is positioned in said holes after which free longitudinal movement of said test pins is permitted an amount limited by the length of said grooved section which is greater than the thickness of said compliant plate means.

In a testing apparatus for electronically testing printed circuit boards or other products, the improvement comprising, in combination:

• a plurality of integrally formed, generally parallel test pins making electrical contact between areas on a product to be tested and corresponding contact elements of an electrical test system, each of said test pins having a first tapered end and a second tapered end defining a length of each of the test pins and further having a continuously uniform diameter along an entire length defined between the first tapered end and the second tapered end wherein the uniform diameter is the maximum diameter of the pin along the length and further wherein the first tapered end of the test pin contacts the product to be tested and the second tapered end of the test pin contacts a contact element of the electrical test system;
• a reduced cross-section portion defined between shoulders defining a reduced cross-section length, a total length of said reduced cross-section portion being less than the entire length of said uniform diameter portion;
• and
• plate means having holes formed therein defining an area larger than said reduced cross-section portion of said test pins, said test pins mounted with said reduced cross-section portion in said holes whereby said plate means is adapted to cooperate with said shoulders to retain said test pins in said testing apparatus.