Method and system for determining the location of an open circuit in a semiconductor device using power modulation
AssigneeAdvanced Micro Devices, Inc.
InventorRichard C. Blish, II
Life of this patent
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Abstract
A system and method for detecting a location of an open circuit is disclosed. The open circuit is in a circuit of semiconductor device. The semiconductor device has a surface. The method and system include supplying alternating power to the semiconductor device and sensing a time-varying signal that is related to the alternating power. The method and system also include determining where the signal is substantially changed.
Claims7
A method for detecting a location of an open circuit in a circuit of semiconductor device having a surface, the method comprising the steps of:
- (a) supplying alternating power to the semiconductor device;
- (b) sensing a time-varying signal related to the alternating power from the surface of the semiconductor device using at least a first antenna, the time-varying signal being based on an electromagnetic radiation signal;
- and
- (c) determining where the time-varying signal is substantially changed
- wherein the time varying signal includes a magnitude and a phase, and wherein the sensing step (b) further includes the step of:
- (b1) utilizing the first antenna and a second antenna provide the time-varying signal, the first antenna sensing a first signal in proximity to the surface of the semiconductor die and the second antenna sensing a second signal in proximity to the surface of the semiconductor device, the time-varying signal being an interference signal between the first signal and the second signal.
A system for detecting a location of an opt circuit in a circuit of semiconductor device having a surface, the system comprising:
- an alternating power supply for supplying power to the circuit in the semiconductor device;
- and
- a sensor for sensing a time-varying signal related to the alternating power from the surface of the semiconductor device, the sensor including at least a first antenna, the time-varying signal being based on an electromagnetic radiation signal;
- wherein the location of the open circuit is in proximity to a location that the time-varying signal is substantially changed;
- wherein the sensor further includes a second antenna, the first antenna for sensing a first signal in proximity to the surface of the semiconductor device and the second antenna for sensing a second signal in proximity to the surface of the semiconductor device;
- and
- Wherein the time-varying signal is an interference signal between the first signal and the second signal.
Dependencies are inferred from the claim text.