US 6,283,780 B1 · Test socket lattice

Abstract

A socket is provided for burn-in testing of an integrated circuit package having electrical leads. The socket includes a socket body having an array of columns and rows of generally rectangular terminal-receiving cavities therein, each of the generally rectangular terminal-receiving cavities having a longitudinal direction corresponding to its longer dimension and a plurality of terminals disposed in the terminal-receiving cavities for contacting the leads of the integrated circuit package. Each column and row of the array includes a sequence of at least three adjacent cavities wherein for each cavity of the sequence other than the first and last, the longitudinal direction of the cavity is substantially perpendicular to the longitudinal direction of the two cavities in the sequence adjacent the cavity on either side.

Claims14

Dependent claims

A socket for bum-in testing of an integrated circuit (“IC”) package, the IC package having a plurality of conductive electrical leads disposed thereon, the socket comprising:

a socket body that receives at least a portion of the IC package during testing, the socket body including a base member for effecting contact with said IC package leads, the base member having an array of cavities disposed therein;
a plurality of conductive terminals, a single terminal being disposed in a single cavity, the terminals contacting said leads of said IC package when said IC package is received in said socket;
each of said cavities having a rectangular configuration with at least four sides arranged in two pairs of opposing first and second sides, said first sides having lengths that are greater than said second sides;
said rectangular cavities being disposed in said base member in a lattice arrangement, wherein each rectangular cavity is surrounded by at least three adjacent rectangular cavities and such that at least one of said first side of said rectangular cavity is opposed by second sides of said adjacent rectangular cavities.

1 more element

A socket for burn-in testing of an integrated circuit (“IC”) package, the IC package having a plurality of conductive electrical leads disposed thereon, the socket comprising:

a socket body that receives at least a portion of the IC package during testing, the socket body including a base member for effecting contact with said IC package leads, the socket body base member having an array of cavities disposed therein the cavities each having a uniform rectangular configuration, said cavities further being oriented in said socket body base member;
a plurality of conductive terminals, a single terminal being disposed in a single cavity, the terminals contacting said leads of said IC package when said IC package is received in said socket;
each of said cavities having at least two pairs of distinct first and second sides, said first sides being longer in length than lengths of said second sides, said cavities being disposed in said base member in an arrangement to increase density of said socket terminals without compromising strength of said socket, the arrangement being wherein each cavity is surrounded by at least three adjacent cavities and each cavity extends perpendicular to adjacent cavities and, at least one of the first sides of each cavity being flanked in opposition by second sides of two of said adjacent cavities.

Dependencies are inferred from the claim text.

Test socket lattice

Life of this patent

Test socket lattice

Life of this patent

Abstract

Claims14