Temperature measuring method using radiation thermometer
AssigneeTokyo Electron Limited
InventorMinoru Yazawa
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AssigneeTokyo Electron Limited
InventorMinoru Yazawa
Estimating the term…
A temperature measuring method measures the temperature of a measuring object, such as a semiconductor wafer, by a radiation thermometer capable of approximating the relation between its output and the temperature of the measuring object by a predetermined straight line and of being calibrated by properly determining a slope and a y-intercept for the straight line. The measuring method carries out a procedure including the steps of measuring the reflectivity of a measuring object regarding the light of a wavelength that is not transmitted by the measuring object, and determining a slope and a y-intercept for a proper straight line for the measuring object on the basis of results of processing the measuring object by a predetermined process, such as a film forming process, that provides a result, such as the thickness of a film, corresponding to process temperature. The procedure is repeated for a plurality of measuring objects to determine the relation between the reflectivity of the measuring object, and the slope and y-intercept of the proper straight line. The radiation thermometer is calibrated on the basis of the relation, and the temperature of the measuring objects is measured.
A temperature measuring method of measuring a temperature of an object by a radiation thermometer capable of approximating the relation between its output and an actual temperature of the object by a predetermined straight line and of being calibrated by properly determining a slope and a y-intercept for the straight line, said measuring method comprising the steps of:
A temperature measuring method of measuring a temperature of an object by a radiation thermometer capable of approximating the relation between its output and an actual temperature of the object by a predetermined straight line and of being calibrated by properly determining a slope and a y-intercept for the straight line, said measuring method comprising the steps of:
Dependencies are inferred from the claim text.