Scanning probe microscope assembly and method for making confocal, spectrophotometric, near-field, and scanning probe measurements and associated images

A microscope assembly comprising:

• scanning and measurement means to:
• scan an object;
• make measurements of the object while the object is scanned;
• and
• generate measurement data representing the measurements;
• a pointing device;
• a controller configured to:
• control the scanning and measurement means in scanning and making measurements of the object;
• generate first image data representing a first image associated with the object in response to the measurement data;
• generate second image data representing a second image of the first image and a measuring tool projected on the first image in response to the first image data, the measuring tool including endpoint cursors that can be manipulated with the pointing device to position the measuring tool so as to select a cross section of the first image between the endpoint cursors;
• generate cross section data representing cross section information about the selected cross section between the endpoint cursors of the measuring tool;
• format the second image data for display of the second image;
• and
• format the cross section data for display of the cross section information;
• and
• a display configured to:
• display the second image in response to the formatted second image data;
• and
• display the cross section information in response to the formatted cross section data.