Test probe cleaning
AssigneeIntel Corporation
InventorDean E. Gonzales
Life of this patent
Estimating the term…
Abstract
The present invention relates to apparatus and methods for cleaning debris from a test probe. Debris is cleaned from the test probe by oxidizing the test probe debris in an oxidizing agent and dissolving said oxidized debris in a cleaning agent. Preferably, a membrane, such as a liquid polymer, is disposed over the oxidizing agent and/or the cleaning agent to prevents any off-gassing of either agent, prevent reaction of either agent with ambient atmosphere or each other, and/or prevent either agent being spilled and/or having personnel exposed to either agent.
Claims30
A method of cleaning a test probe, comprising:
- providing at least one test probe having a debris thereon;
- oxidizing said test probe debris in an oxidizing agent;
- and
- dissolving said oxidized debris in a cleaning agent.
A method of cleaning a test probe, comprising:
- providing at least one test probe having a debris thereon;
- providing a layered, cleaning material comprising:
- a cleaning agent;
- and
- an oxidizing agent disposed over said cleaning agent;
- inserting said test probe into said oxidizing agent;
- and
- inserting said test probe into said cleaning agent.
A layered, test probe cleaning material, comprising:
- a reservoir;
- a cleaning agent disposed within said reservoir;
- and
- an oxidizing agent disposed over said cleaning agent within said reservoir.
Dependencies are inferred from the claim text.