Apparatus and method for electrolytically depositing copper on a semiconductor workpiece
AssigneeSemitool, Inc.
InventorLinLin Chen
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AssigneeSemitool, Inc.
InventorLinLin Chen
Estimating the term…
This invention employs a novel approach to the copper metallization of a workpiece, such as a semiconductor workpiece. In accordance with the invention, an alkaline electrolytic copper bath is used to electroplate copper onto a seed layer, electroplate copper directly onto a barrier layer material, or enhance an ultra-thin copper seed layer which has been deposited on the barrier layer using a deposition process such as PVD. The resulting copper layer provides an excellent conformal copper coating that fills trenches, vias, and other microstructures in the workpiece. When used for seed layer enhancement, the resulting copper seed layer provide an excellent conformal copper coating that allows the microstructures to be filled with a copper layer having good uniformity using electrochemical deposition techniques. Further, copper layers that are electroplated in the disclosed manner exhibit low sheet resistance and are readily annealed at low temperatures.
A process for applying a metal structure to a workpiece comprising:
A process for applying a metal structure to a workpiece comprising:
A process for applying a metal structure to a workpiece comprising:
A process for applying a metal structure to a workpiece comprising:
A copper electroplating solution comprising copper sulfate at a level of 0.03 to 0.5 Molar, boric acid at a level of 0.01 to 0.5 Molar, a complexing agent selected from the group consisting of ED, EDTA, and a polycarboxylic acid at a level for a molar ratio of complexing agent to copper sulfate in the range of 1 to 4, and an alkaline agent in an amount sufficient to increase the pH of the solution to at least 9.0, the solution being formulated so as to be suitable for electrodeposition of copper onto a microelectronic workpiece.
Dependencies are inferred from the claim text.