Surface flatness measuring apparatus
AssigneeSystem Seiko Co., Ltd.
InventorsTetsuya Iwata, Makoto Hirokawa
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AssigneeSystem Seiko Co., Ltd.
InventorsTetsuya Iwata, Makoto Hirokawa
Estimating the term…
A flatness measuring apparatus is adapted to measure the flatness of the surface of a plate-shaped object such as a disk in a non-contact fashion. A disk is removably held by a measuring table, with the projection of the measuring table engagedly received in a central through hole of the disk. A plurality of eddy current undulation sensors are arranged in a sensor head that is arranged so as to be able to linearly move back and forth along the measuring table. Said eddy current undulation sensors generate an eddy current in said disk and detect any undulation on the surface of said disk. A flatness map is produced for the surface of the disk based on a signal representing the position of the sensor head and on signals from the eddy current undulation sensors, and then is output to a display and/or a printer.
A flatness measuring apparatus for measuring flatness of a surface of an electrically conductive disk comprising:
Dependencies are inferred from the claim text.