Apparatus for plasma ion trimming of frequency devices

A system for trimming frequency devices, comprising:

• a plasma ion chamber for ion bombardment of the frequency devices, wherein the plasma ion chamber comprises:
• a bell jar for providing a hermetically sealable chamber for conducting plasma ion bombardment;
• a bell jar hinge assembly coupled to the bell jar for opening and closing a surface of the bell jar;
• an insertion/extraction port coupled to the bell jar for inserting and removing the frequency devices from the plasma ion chamber;
• and
• an ion gun coupled to the bell jar for conducting plasma ionization within the plasma ion chamber;
• a baseplate located internal to the bell jar for mounting a plurality of mechanical components;
• a drive assembly coupled to the baseplate for controlling the movement of a boat containing the frequency devices;
• an ionization station coupled to the baseplate for regulating the plasma ion bombardment of the frequency devices;
• and
• a shutter mechanism coupled to the baseplate for interfacing with the ionization station;
• a magazine rack coupled to the plasma ion chamber for storing a plurality of the frequency devices;
• a vacuum evacuator coupled to the plasma ion chamber for creating a vacuum in the plasma ion chamber;
• a plasma power supply coupled to the plasma ion chamber for providing power to the ion gun;
• a frequency evaluator coupled to the plasma ion chamber for determining the frequency of the frequency devices;
• and
• a control console coupled to the plasma ion chamber, the magazine rack, the vacuum evacuator, the plasma power supply and the frequency evaluator for controlling the operation of the system.