Exposure method and X-ray mask structure for use with the same
AssigneeCanon Kabushiki Kaisha
InventorsKeiko Chiba, Shunichi Uzawa, Mitsuaki Amemiya, Yutaka Watanabe
Life of this patent
Estimating the term…
Loading patent…
AssigneeCanon Kabushiki Kaisha
InventorsKeiko Chiba, Shunichi Uzawa, Mitsuaki Amemiya, Yutaka Watanabe
Estimating the term…
An exposure method for printing a pattern onto a workpiece to be exposed, includes a first exposure step for forming, on the workpiece and by exposure, a transferred image of a first absorbing material pattern formed on a mask and having no periodic structure, and a second exposure step for printing, on the workpiece and by exposure, a diffraction pattern to be produced through Fresnel diffraction due to a second absorbing material pattern formed on the mask and having a periodic structure, the diffraction pattern having a period corresponding to 1/n of a period of the transferred image of the periodic structure pattern, where n is an integer not less than 2, and wherein the first and second exposure steps are performed simultaneously.
An exposure method for printing a pattern onto a workpiece to be exposed, said method comprising:
A mask structure for use in printing a pattern on a workpiece to be exposed, said mask structure comprising:
A device, comprising:
A device manufacturing method, comprising:
Dependencies are inferred from the claim text.