Method and apparatus for wavelength calibration
AssigneeLambda Physik AG
InventorsJürgen Kleinschmidt, Uwe Stamm, Klaus Vogler, Peter Lokai
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AssigneeLambda Physik AG
InventorsJürgen Kleinschmidt, Uwe Stamm, Klaus Vogler, Peter Lokai
Estimating the term…
A wavelength calibration system determines an absolute wavelength of a narrowed spectral emission band of an excimer or molecular laser system. The system includes a module including an element which optically interacts with a component of an output beam of the laser within the tunable range of the laser system around the narrowed band. An inter-level resonance is detected by monitoring changes in voltage within the module, or photo-absorption is detected by photodetecting equipment. The absolute wavelength of the narrowed band is precisely determinable when the optical transitions occur and are detected. When the system specifically includes an ArF-excimer laser chamber, the module is preferably a galvatron containing an element that photo-absorbs around 193 nm and the element is preferably a gas or vapor selected from the group consisting of arsenic, carbon, oxygen, iron, gaseous hydrocarbons, halogenized hydrocarbons, carbon-contaminated inert gases, germanium and platinum vapor. When the system specifically includes F2-laser chamber, the module is preferably a galvatron containing an element that photo-absorbs around 157 nm and the element is preferably a gas or vapor selected from the group consisting of selenium, bromine and silicon. The module is alternatively a purge chamber configurable for purging with a photo-absorbing gas.
A narrow band ArF-excimer laser system, comprising:
A method for calibrating the absolute wavelength of spectral emission of a narrow emission ArF-excimer laser system including a wavelength calibration system including a wavelength calibration module filled with a gas having a plurality of optical inter-level transitions within the broadband emission spectrum of said excimer laser, comprising the steps of:
A wavelength calibration system for measuring an absolute wavelength of a narrowed spectral emission of an excimer or molecular fluorine laser including a discharge chamber and a resonator, comprising:
A narrow band excimer laser system including an excimer laser chamber and optical resonator, a spectral narrowing and tuning unit that produces a narrowed spectral emission having a bandwidth of less than 1 pm within a range of a broadband emission spectrum of said laser, a microprocessor unit for controlling the laser system, and a detection and control unit for relative wavelength detection, control and tuning, the improvement comprising:
A method for determining the absolute wavelength of spectral emission of a narrow band excimer or molecular fluorine laser system including a wavelength calibration system including a gas-filled module having a photoabsorbing, medium therein, said photoabsorbing medium having a plurality of optical absorption lines within the broadband emission spectrum of said laser system, comprising the steps of:
An excimer laser system generating a narrow band output beam of a known wavelength and having a bandwidth of less than 1 pm comprising:
A method for calibrating the absolute wavelength of spectral emission of a narrow emission laser including a wavelength calibration unit filled with a gas having a plurality of optical inter-level transitions within the emission spectrum of said laser, comprising the steps of:
A method for determining the absolute wavelength of a narrowed spectral emission of a narrow band laser system including a wavelength calibration system including a module filled with a medium including a photoabsorbing gas having a plurality of optical absorption lines within the emission spectrum of said laser, comprising the steps of:
Dependencies are inferred from the claim text.