Apparatus and method for measuring two opposite surfaces of a body
AssigneeNanopro Luftlager-Produktions-und Messtechnik GmbH
InventorDieter Müller
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AssigneeNanopro Luftlager-Produktions-und Messtechnik GmbH
InventorDieter Müller
Estimating the term…
An apparatus and a method are provided which allow two opposite plane surfaces of a body to be interferometrically measured simultaneously using light from a single light source. From a parallel light beam (P) produced by a light source (1) partial light beams (A, B) having positive and negative diffraction angles are produced using a beam splitter (8) in the form of a diffraction grating. The partial light beams strike the respective surfaces (90, 91) of the body (9) to be measured and are reflected thereat. The reflected partial light beams (A, B) are interfered with the throughgoing partial light beam (P) having an order of diffraction of zero and the thus produced interference patterns are digitized and subtracted from each other, whereby the parallelism of both surfaces (90, 91) of the body can be determined.
An apparatus for simultaneously measuring two opposite planar surfaces of a flat body, the apparatus comprising:
A method of simultaneously measuring two opposite surfaces of a flat body, said method comprising:
Dependencies are inferred from the claim text.