Probe card

A probe card comprising:

• a base plate,
• a plurality of probe blocks having a front facing portion, said probe blocks being fitted to said base plate substantially in a lattice-like form,
• a plurality of probes connected to said probe blocks, wherein individual probes have a needle point part and a needle rear part,
• a plurality of cross joints for fitting said probe blocks to said base plate in the lattice-like form,
• wherein each front facing portion corresponds to a vertical side of the probe block adjacent to the connected needle point parts, and
• wherein the plurality of probe blocks located around said lattice intersection portion are fitted to said base plate such that the front facing portions are positioned in the same direction, around said lattice intersection portion, in either a clockwise or counter-clockwise direction, with respect to the needle rear part.

A probe card comprising:

• a base plate,
• a plurality of probe blocks having a probe group including a plurality of probes, said probe blocks being fitted to said base plate substantially in a lattice-like form,
• wherein individual probes have a needle point part and a needle rear part,
• a probe set-up means, wherein said probe set-up means includes an insulating plate fitted to said base plate, said insulating plate having a plurality of slots which extend along two imaginary boundary lines intersecting each other and are arranged substantially in the lattice-like form, wherein the probes of each probe block are fitted to said insulating plate so as to penetrate through the slot, and
• wherein the probe groups located around said lattice intersection portion are fitted to said base plate such that the needle point parts extend, around said lattice intersection portion, in the same direction relative to the fitting position of the probes to the insulating plate, in either a clockwise or counter-clockwise direction.