Biased BGA contactor probe tip
AssigneeDelaware Capital Formation, Inc.
InventorsMark A. Swart, Charles J. Johnston, Gordon A. Vinther
Life of this patent
Estimating the term…
Abstract
A spring probe for performing tests on an electrical device having a plunger positioned within a barrel and including a spring in the barrel adjacent the plunger to apply a spring force against the plunger. The plunger includes a contact end having an angled surface for contacting the electrical device for applying a side load to the barrel, and a slot in the contact end for dividing the spring force upon contact with the electrical device.
Claims10
A spring probe for performing tests on an electrical device comprising;
- a plunger;
- a barrel for receipt of at least a portion of the plunger;
- and
- a spring positioned in the barrel adjacent the plunger to apply a spring force against the plunger;
- said plunger having a contact end having an angled surface extending across an entire width of the contact end for contacting the electrical device for applying a side load to the barrel, and a single slot extending across an entire width of the contact end for dividing the spring force upon contact with the electrical device.
A plunger for a contact probe comprises a contact end with at least one angled surface for applying a side load and a slot both extending across an entire width of the contact end.
Dependencies are inferred from the claim text.