Test head positioner for semiconductor device testing apparatus

Abstract

A hand-operated test head positioner for positioning the test head of a semiconductor device testing apparatus is provided which is easy to operate, highly safe in operation, and yet inexpensive. Two air cylinders are installed one at each of two opposed positions of the test head. The sum of driving forces of these air cylinders is set at a level approximately equivalent to the weight of the test head to act as a counterbalancer. Hand-operated jack mechanisms are disposed on the opposite side walls of the test head, respectively. The jack mechanisms comprise long lead screws rotatably supported, two movable screw members in threaded engagement with the respective lead screws, drive arms pivotally connected at one ends to the respective movable screw members, and driven arms having approximately the same shape and size as the drive arms and being pivotally connected to the respective drive arms, respectively. By manually rotating one of the lead screws, the movable screw members are simultaneously moved thereby moving the test head vertically upwardly and downwardly.

Dependencies are inferred from the claim text.