Probe holder for low current measurements

A system for low-current testing of a test device comprising:

• (a) a probing device for probing a probing site on said test device, said probing device including a dielectric substrate having first and second sides, an elongate conductive path on said first side of said substrate, an elongate probing element connected to one end of said elongate conductive path so as to extend in a cantilevered manner beyond said substrate, and a conductive area on said second side of said substrate;
• (b) a probe housing matingly detachably engageable with said probing device;
• (c) said probe housing being detachably engageable with both a first cable that includes a first conductor surrounded by a second conductor and a second cable that includes a third conductor surrounded by a fourth conductor;
• (d) a coupler that electrically interconnects said first conductor, said third conductor, and said elongate conductive path on said first side of said substrate when said probing device is engaged with said probe housing, said first cable is engaged with said probe housing, and said second cable is engaged with said probe housing;
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• (e) said probe housing electrically interconnects, at least in part, said second conductor and said fourth conductor with said conductive area on said second side of said substrate when said probing device is engaged with said probe housing.

A probe housing for holding a test device comprising:

• (a) said probe housing matingly detachably engageable with a probing device for probing a probing site on said test device that includes a dielectric substrate having first and second sides, an elongate conductive path on said first side of said substrate, an elongate probing element connected to one end of said elongate conductive path so as to extend in a cantilevered manner beyond said substrate, and a conductive area on said second side of said substrate;
• (b) said probe housing being detachably engageable with both a first cable that includes a first conductor surrounded by a second conductor and a second cable that includes a third conductor surrounded by a fourth conductor;
• (c) a coupler that electrically interconnects said first conductor, said third conductor, and said elongate conductive path on said first side of said substrate when said probing device is engaged with said probe housing, said first cable is engaged with said probe housing, and said second cable is engaged with said probe housing;
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• (d) said probe housing electrically interconnects, at least in part, said second conductor and said fourth conductor with said conductive area on said second side of said substrate when said probing device is engaged with said probe housing.

A system for low-current testing of a test device comprising:

• (a) a probe housing matingly detachably engageable with a probing device for probing a probing site on said test device, said probing device includes an inner conductor, an inner dielectric, and an outer conductor, said probing device further including an inner layer of material between said inner dieletric and said outer conductor of suitable composition for reducing triboelectric current generation between said inner dielectric and said outer conductor to less than that which would occur were said inner dielectric and said outer conductor to directly adjoin each other;
• (b) said probe housing being detachably engageable with both a first cable that includes a first conductor surrounded by a second conductor and a second cable that includes a third conductor surrounded by a fourth conductor;
• (c) a coupler that electrically interconnects said first conductor, said third conductor, and said inner conductor when said probing device is engaged with said probe housing, said first cable is engaged with said probe housing, and said second cable is engaged with said probe housing;
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• (d) said probe housing electrically interconnects, at least in part, said fourth conductor, said second conductor, and said outer conductor when said probing device is engaged with said probe housing, where said coupler is electrically isolated from said probe housing.

A system for low-current testing of a test device comprising:

• (a) a probing device for probing a probing site on said test device, said probing device including a dielectric substrate having first and second sides, an elongate conductive path on said first side of said substrate, an elongate probing element connected to one end of said elongate conductive path so as to extend in a cantilevered manner beyond said substrate, and a conductive area on said second side of said substrate;
• (b) a probe housing matingly detachably engageable with said probing device;
• (c) said probe housing being detachably engageable with at least a first cable that includes a first conductor surrounded by a second conductor;
• (d) a coupler electrically interconnects said first conductor and said elongate conductive path on said first side of said substrate when said probing device is engaged with said probe housing, and said first cable is engaged with said probe housing;
• and
• (e) said probe housing electrically interconnects, at least in part, said second conductor with said conductive area on said second side of said substrate when said probing device is engaged with said probe housing, where said coupler is electrically isolated from said probe housing.

A system for low-current testing of a test device comprising:

• (a) a probe housing matingly detachably engageable with a probing device for probing a probing site on said test device, said probing device includes an inner conductor, an inner dielectric, and an outer conductor, said probing device further including an inner layer of material between said inner dielectric and said outer conductor of suitable composition for reducing triboelectric current generation between said inner dielectric and said outer conductor to less than that which would occur were said inner dielectric and said outer conductor to directly adjoin each other;
• (b) said probe housing being detachably engageable with at least a cable that includes a first conductor surrounded by a second conductor;
• (c) a coupler electrically interconnects said first conductor and said inner conductor when said probing device is engaged with said probe housing, said cable is engaged with said probe housing;
• and
• (d) said probe housing, at least in part, electrically interconnects said second conductor with said outer conductor when said probing device is engaged with said probe housing, where said coupler is electrically isolated from said probe housing.