Microwave enhanced CVD system under magnetic field
AssigneeSemiconductor Energy Laboratory Co., Ltd.
InventorShunpei Yamazaki
Life of this patent
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Abstract
An improved chemical vapor deposition or etching is shown in which cyclotron resonance and photo or plasma CVD cooperate to deposit a layer with high performance at a high deposition speed. The high deposition speed is attributed to the cyclotron resonance while the high performance is attributed to the CVDS.
Claims37
A plasma processing apparatus comprising:
- a resonance chamber;
- a gas introducing means for introducing a process gas into the resonance chamber;
- a means for emitting a microwave into the resonance chamber;
- a means for inducing a magnetic field in the resonance chamber to form an electron cyclotron resonance in order to convert said process gas to a plasma;
- a reaction chamber connected above the resonance chamber wherein the plasma flows from the resonance chamber to the reaction chamber;
- a substrate having a surface to be treated placed in the reaction chamber, wherein said substrate is supported within said reaction chamber above said resonance chamber;
- and
- exhaust means for exhausting said reaction chamber, wherein a port of said exhaust means is positioned within said reaction chamber between said substrate and said resonance chamber.
A plasma processing apparatus comprising:
- a plasma forming resonance chamber;
- a gas introducing means for introducing a process gas into the plasma forming resonance chamber;
- a means for emitting a microwave into the plasma forming resonance chamber;
- a means for inducing a magnetic field in the plasma forming resonance chamber to form an electron cyclotron resonance in order to convert said process gas to a plasma;
- an object treatment chamber adjoining the plasma forming resonance chamber above the plasma forming resonance chamber;
- a single substrate having a surface to be treated placed in the object treatment chamber wherein said substrate is supported within said object treatment chamber above a single opening of said plasma forming resonance chamber;
- exhaust means for exhausting said object treatment chamber, said exhaust means including a port positioned within said object treatment chamber between said substrate and said resonance chamber.
A plasma processing method comprising:
- introducing a process gas into a plasma forming chamber;
- emitting a microwave into the plasma forming chamber;
- inducing a magnetic field in the plasma forming chamber to form an electron cyclotron resonance in order to convert said process gas to a plasma;
- providing an object treatment chamber adjoining the plasma forming chamber wherein said object treatment chamber is positioned above said plasma forming chamber;
- positioning a substrate having a surface to be treated in the object treatment chamber above said plasma forming chamber;
- exhausting said treatment chamber with an exhaust means wherein a port of said exhaust means is positioned between said substrate and said plasma forming chamber.
A plasma processing method comprising:
- introducing a process gas into a plasma forming chamber;
- emitting a microwave into the plasma forming chamber;
- inducing a magnetic field in the plasma forming chamber to form an electron cyclotron resonance in order to convert said process gas to a plasma;
- providing an object treatment chamber adjoining the plasma forming chamber wherein said object treatment chamber is positioned above said plasma forming chamber;
- positioning a single substrate having a surface to be treated in the object treatment chamber wherein said substrate is supported within said object treatment chamber above a single opening of said plasma forming resonance chamber;
- exhausting said treatment chamber with an exhaust means wherein a port of said exhaust means is positioned between said substrate and said plasma forming chamber.
A plasma CVD apparatus:
- a resonance chamber;
- a means for emitting a microwave into the resonance chamber;
- a means for inducing a magnetic field in the resonance chamber to form an electron cyclotron resonance in order to form a plasma;
- a reaction chamber connected above the resonance chamber wherein the plasma flows from the resonance chamber to the reaction chamber;
- a gas introducing means for introducing a reactive gas into said reaction chamber;
- a substrate having a surface to be treated placed in the reaction chamber wherein said substrate is horizontally arranged so that said surface faces toward said resonance chamber;
- and
- exhaust means for exhausting said reaction chamber, wherein a port of said exhaust means is positioned within said reaction chamber between said substrate and said resonance chamber.
A plasma CVD apparatus:
- a resonance chamber;
- a means for emitting a microwave into the resonance chamber;
- a means for inducing a magnetic field in the resonance chamber to form an electron cyclotron resonance in order to form a plasma;
- a reaction chamber connected above the resonance chamber wherein the plasma flows from the resonance chamber to the reaction chamber;
- a gas introducing means for introducing a reactive gas into said reaction chamber;
- a single substrate having a surface to be treated placed in the reaction chamber wherein said substrate is arranged horizontally so that said surface faces toward a single opening of said resonance chamber;
- and
- exhaust means for exhausting said reaction chamber, wherein a port of said exhaust means is positioned within said reaction chamber between said substrate and said resonance chamber.
A plasma processing method comprising:
- introducing a microwave into a resonance chamber;
- inducing a magnetic field in the resonance chamber to form an electron cyclotron resonance in order to form a plasma;
- providing a reaction chamber adjoining the resonance chamber wherein said reaction chamber is positioned above said resonance chamber;
- introducing a reactive gas into said reaction chamber;
- positioning a substrate having a surface in the reaction chamber wherein said substrate is horizontally arranged so that said surface faces toward said resonance chamber;
- exhausting said reaction chamber with an exhaust means wherein a port of said exhaust means is positioned between said substrate and said resonance chamber;
- and
- depositing a film on the surface of said substrate by plasma CVD.
A plasma processing method comprising:
- introducing a microwave into a resonance chamber;
- inducing a magnetic field in the resonance chamber to form an electron cyclotron resonance in order to form a plasma;
- providing a reaction chamber adjoining the resonance chamber wherein said reaction chamber is positioned above said resonance chamber;
- introducing a reactive gas into said reaction chamber;
- positioning a single substrate having a surface in the reaction chamber wherein said substrate is horizontally arranged so that said surface faces toward a single opening of said resonance chamber;
- exhausting said reaction chamber with an exhaust means wherein a port of said exhaust means is positioned between said substrate and said resonance chamber;
- and
- depositing a film on the surface of said substrate by plasma CVD.
A plasma CVD apparatus:
- a resonance chamber;
- a means for emitting a microwave into the resonance chamber;
- a means for inducing a magnetic field in the resonance chamber to form an electron cyclotron resonance in order to form a plasma;
- a reaction chamber connected above the resonance chamber wherein said reaction chamber has a side wall which extends perpendicularly;
- a gas introducing means for introducing a reactive gas into said reaction chamber;
- a substrate having a surface to be treated placed in the reaction chamber wherein said substrate is horizontally arranged so that said surface faces toward said resonance chamber;
- and
- exhaust means for exhausting said reaction chamber, wherein a port of said exhaust means is positioned on the side wall of said reaction chamber between said substrate and said resonance chamber.
A plasma CVD apparatus:
- a resonance chamber;
- a means for emitting a microwave into the resonance chamber;
- a means for inducing a magnetic field in the resonance chamber to form an electron cyclotron resonance in order to form a plasma;
- a reaction chamber connected above the resonance chamber wherein said reaction chamber has a side wall which extends perpendicularly;
- a gas introducing means for introducing a reactive gas into said reaction chamber;
- a single substrate having a surface to be treated placed in the reaction chamber wherein said substrate is arranged horizontally so that said surface faces toward a single opening of said resonance chamber;
- and
- exhaust means for exhausting said reaction chamber, wherein a port of said exhaust means is positioned within said reaction chamber between said substrate and said resonance chamber.
A plasma processing method comprising:
- introducing a microwave into a resonance chamber;
- inducing a magnetic field in the resonance chamber to form an electron cyclotron resonance in order to form a plasma;
- providing a reaction chamber adjoining the resonance chamber wherein said reaction chamber is located above said resonance chamber and has a side wall which extends perpendicularly;
- introducing a reactive gas into said reaction chamber;
- positioning a substrate having a surface in the reaction chamber wherein said substrate is horizontally arranged so that said surface faces toward said resonance chamber;
- exhausting said reaction chamber with an exhaust means wherein a port of said exhaust means is positioned on said side wall between said substrate and said resonance chamber;
- and
- depositing a film on the surface of said substrate by plasma CVD.
A plasma processing method comprising:
- introducing a microwave into a resonance chamber;
- inducing a magnetic field in the resonance chamber to form an electron cyclotron resonance in order to form a plasma;
- providing a reaction chamber adjoining the resonance chamber wherein said reaction chamber is positioned above said resonance chamber and has a side wall which extends perpendicularly;
- introducing a reactive gas into said reaction chamber;
- positioning a single substrate having a surface in the reaction chamber wherein said substrate is horizontally arranged so that said surface faces toward a single opening of said resonance chamber;
- exhausting said reaction chamber with an exhaust means wherein a port of said exhaust means is positioned on said side wall between said substrate and said resonance chamber;
- and
- depositing a film on the surface of said substrate by plasma CVD.
Dependencies are inferred from the claim text.