Visualizing methods for dispatch and diagnosis of finite machines for semiconductor's manufacturing

A method for visualizing a working condition of stages in semiconductor manufacturing, comprising the steps of:

• determining quantities of semiconductor wafers in a supplied stage, comprising the quantity of the wafers which are waiting for processing in said supplied stage, the wafers which are processed in said supplied stage and the wafers which are at the end of the process in said supplied stage, then putting said quantities of semiconductor wafer in said supplied stage sequentially into an upper strip;
• determining quantities of semiconductor wafers in a requested stage, comprising the quantity of the wafers which are pre-processed in said requested stage, the wafers which are waiting for processing in said requested stage and the wafers which are under processing in said requested stage, then putting the quantities of semiconductor in said requested stage into an under sequentially;
• linking said upper strip to said under strip;
• forming a bar chart for visually representing said quantities of semiconductor wafers in said stages by listing a plurality of said linked upper and under strips according to a manufacturing sequence;
• setting up two standard lines on said upper strip and said under strip for evaluating said quantities of semiconductor in said supplied stages and said requester stages;
• and
• deciding dispatching priorities for said supplied stage and said requested stage.