Magnetron for low pressure, full face erosion
AssigneeApplied Materials, Inc.
InventorsAvi Tepman, James van Gogh
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AssigneeApplied Materials, Inc.
InventorsAvi Tepman, James van Gogh
Estimating the term…
A method for controlling the operation of a magnetron source for sputtering a surface of a target in a vacuum chamber, the method including the steps of: during a low pressure phase of sputtering, causing a magnetic field generated by a the magnetron source to be confined primarily to an inner region of the surface of the target so as to reduce leakage of electrons away from the target during sputtering; and during a subsequent high pressure phase of sputtering, causing the magnetic field generated by the magnet assembly to extend into the outer region of the surface of the target so as to sputter material from the outer region of the surface of the target. The pressure of the high pressure phase of sputtering is higher than the pressure of the low pressure phase of sputtering.
A magnetron source for use in a plasma system for sputtering a surface of a target, said magnetron comprising:
A plasma system for sputtering a surface of a target, said system comprising:
Dependencies are inferred from the claim text.