Simultaneous x-ray fluorescence spectrometer
AssigneeBruker AXS Analytical X-Ray Systems GmbH
InventorRainer Golenhofen
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AssigneeBruker AXS Analytical X-Ray Systems GmbH
InventorRainer Golenhofen
Estimating the term…
A spectrometer for the simultaneous measurement of several spectral lines from a sample (2) with several wavelength selectors (5a, 6a, 7; 5b, 6b, 7) which supply light of a certain wavelength selectively to a detector (9), wherein each wavelength selector selects a different wavelength, is characterized in that at least two different wavelength selectors (5a, 6a, 7; 5b, 6b, 7) can supply light from the sample (2) to the same detector (9) and that the detector (9) is energy-dispersive and has sufficiently large resolution in order to energy separate the detected light of the various wavelengths from the at least two different wavelength selectors. In this manner it is possible on the one hand to achieve the high resolution of known wavelength-dispersive arrangements with relatively short measuring times due to simultaneous measurements of different wavelength ranges and on the other hand the number of detectors and associated measurement electronics is considerably reduced without requiring in turn a considerably higher effort on the mechanical side of the apparatus.
A spectrometer for the measurement of spectral lines emitted from a sample, the spectrometer comprising:
An X-ray fluorescence spectrometer for the simultaneous measurement of several spectral X-ray fluorescence lines emitted from a sample, the spectrometer comprising
The spectrometer of claim 20, wherein the wavelength selectors are arranged essentially in a plane in the form of a star about an axis between the sample and the detector.
Dependencies are inferred from the claim text.