X-ray examination apparatus including an image sensor matrix with a correction unit
AssigneeU.S. Philips Corporation
InventorsHendrik J. Meulenbrugge, Peter L. Alving, Johannes A. Luijendijk, Johannes J. Stouten
Life of this patent
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Abstract
An X-ray examination apparatus utilizes an image sensor matrix for picking up an X-ray image, i.e. for converting incident X-rays into electric charges. The X-ray examination apparatus includes a control circuit for controlling the image sensor matrix so as to form a dark signal. The X-ray examination apparatus also includes a correction unit which is arranged to derive the electronic image signal from the primary image and the dark signal. The electronic image signal represents image information in the X-ray image and has not been disturbed by electric charges which have been read with a delay.
Claims18
An x-ray examination apparatus comprising:
- an x-ray source for emitting x-ray pulses to form x-ray images of an object to be examined,
- an image sensor matrix for generating primary image signals from x-ray images and for generating dark signals in the absence of x-ray images during examination of said object, and
- a control circuit arranged
- to control the x-ray source to emit a series of x-ray pulses to form a series of x-ray images during examination of said object,
- to control the image sensor matrix to generate one or more dark signals prior to acquisition of each x-ray image and to generate one or more primary image signals from each said x-ray image, and that a series of dark signals and a series of primary image signals are processed to generate successive corrected electronic image signals.
An x-ray examination apparatus comprising:
- a first and a second x-ray source for emitting x-ray pulses in different directions to form x-ray images of an object to be examined,
- a first and a second image sensor matrix for generating primary image signals from x-ray images formed by the first and the second x-ray sources, respectively, and for generating dark signals in the absence of x-ray images, and
- a control circuit arranged
- to control the first and second x-ray sources to emit x-ray pulses,
- to control the first image sensor matrix to generate one or more dark signals after an x-ray pulse emitted by the second x-ray source, to generate one or more dark signals prior to an x-ray pulse emitted by the first x-ray source, and to generate one or more primary image signals from an x-ray image formed by the first x-ray source, and
- to control the second image sensor matrix to generate one or more dark signals after an x-ray pulse emitted by the first x-ray source, to generate one or more dark signals prior to an x-ray pulse emitted by the second x-ray source, and to generate one or more primary image signals from an x-ray image formed by the second x-ray source,
- whereby crosstalk between the first and second x-ray sources is reduced.
An x-ray examination apparatus comprising:
- an x-ray source for emitting x-ray pulses to form x-ray images of an object to be examined,
- an image sensor matrix for generating primary image signals from x-ray images and for generating dark signals in the absence of x-ray images during examination of said object, wherein the image sensor matrix further comprises
- a plurality of x-radiation-sensitive semiconductor elements for converting x-rays into electric charges, and
- a reading circuit for generating the primary image signal from the electric charges, and
- a control circuit arranged
- to control the x-ray source to emit x-ray pulses to form x-ray images,
- to control the image sensor matrix to generate one or more dark signals prior to each x-ray image and to generate one or more primary image signals from each x-ray image, and for correcting each of said one or more primary image signals to generate one or more corrected electronic image signals using said one or more dark signals.
Dependencies are inferred from the claim text.