Programmable load circuit for use in automatic test equipment

An apparatus, comprising:

• a) a diode bridge having four nodes, a first of said nodes is an input node, a second of said nodes is an output node, said first and second nodes opposite one another in said diode bridge, a third and fourth of said nodes opposite one another in said diode bridge;
• b) a first and second current source coupled to said third node, a first switch between said third node and said second current source;
• c) third and a fourth current source coupled to said fourth node, a second switch between said fourth node and said fourth current source;
• d) a plurality of diodes in series;
• e) a buffer coupled between said output node and a node within said plurality of diodes in series;
• f) a first diode coupled between said plurality of diodes in series and said fourth node;
• g) a fifth and sixth current source coupled to said first diode and said plurality of diodes in series, a third switch between said sixth current source and said first diode and said plurality of diodes in series;
• h) a second diode coupled between said plurality of diodes in series and said third node;
• and
• i) a seventh and eighth current source coupled to said second diode and said plurality of diodes in series, a fourth switch between said eighth current source and said second diode and said plurality of diodes in series.