Testability circuit for cascode circuits used for high voltage interface
AssigneeTexas Instruments Incorporated
InventorsBernhard H. Andresen, Frederick G. Wall
Life of this patent
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Abstract
A test circuit (10) is provided to enable testing for faults in internal cascode transistors Q2 and Q3, which form part of, for example, a level shifting circuit. Test circuit (10) is comprised of test transistors Q6 and Q7 connected to regulating transistors Q5 and Q8. When Q2 and Q3 are functioning properly, no current flow through test circuit (10). If, however, either or both of Q2 or Q3 has a drain to source short, current flows through test circuit (10) thus providing an indication of the fault.
Claims3
A testable cascode output buffer circuit used with an external voltage greater than a maximum voltage stress level of a single transistor, said output buffer circuit comprising:
- a bias network connected between the external voltage and ground, said bias network producing a first bias voltage equal to the maximum voltage stress level and a second bias voltage equal to a difference between the external voltage and the maximum voltage stress level;
- a cascode configuration of active devices including
- a first switching transistor having a source connected to the external voltage, a gate connected to a first input and a drain connected to a first intermediate node,
- a first cascode transistor having a source connected to the first intermediate node, a gate connected to said second bias voltage and a drain connected to an output node of said output buffer circuit,
- a second cascode transistor having a source connected to said output node, a gate connected to said first bias voltage and a drain connected to a second intermediate node, and
- a second switching transistor having a source connected to said second intermediate node, a gate connected to a second input and a drain connected to ground;
- and
- a test circuit indicating normal operation of said first and second cascode transistors by not conducting and indicating a short of either said first cascode transistor or said second cascode transistor by conducting, said test circuit including
- a first biasing transistor having a source connected to the external voltage, a gate connected to said first bias voltage and a drain connected to a third intermediate node,
- a first test transistor having a source connected to said third intermediate node, a gate connected to said first intermediate node and a drain connected to a fourth intermediate node,
- a second test transistor having a source connected to said third intermediate node, a gate connected to said second intermediate node and a drain connected to said fourth intermediate node, and
- a second biasing transistor having a source connected to said fourth intermediate node, a gate connected to said second bias voltage and a drain connected to ground.
Dependencies are inferred from the claim text.